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An equivalent source to describe realistic synchrotron hard X-rays

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Abstract

An equivalent source model was used to describe realistic third-generation synchrotron hard X-rays to avoid simplifying the light source model excessively or introducing too many variables from optical elements into quantitative calculation. By using particle swarm optimization, through secondary source with different slit apertures, the direct beam diffraction patterns on the detection plane propagated from the simulated equivalent source were in great agreement with the measured patterns. This study is hoped to reduce the difficulty of calculation and improve the accuracy of various coherent imaging or metrology measurements.

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Acknowledgments

This work is supported by the National Natural Science Foundation of China (Grant Nos. 11304339 and U1332120), the Knowledge Innovation Program of Chinese Academy of Sciences and the Scientific Research Foundation for the Returned Overseas Chinese Scholars, State Education Ministry.

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Authors and Affiliations

  1. Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangheng Road 239, Pudong District, Shanghai, 201204, China

    Hui Jiang, Shuai Yan, Hua Wang, Yi Zheng, Zhaohui Dong & Aiguo Li

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  1. Hui Jiang
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  2. Shuai Yan
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  3. Hua Wang
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  4. Yi Zheng
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  5. Zhaohui Dong
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  6. Aiguo Li
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Correspondence to Hui Jiang.

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Jiang, H., Yan, S., Wang, H. et al. An equivalent source to describe realistic synchrotron hard X-rays. Appl. Phys. B 122, 271 (2016). https://doi.org/10.1007/s00340-016-6547-0

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