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Applied Physics B

, Volume 114, Issue 1–2, pp 167–172 | Cite as

Measurement of femtosecond atomic lifetimes using ion traps

  • Elmar TräbertEmail author
Article

Abstract

Two types of experiment are described that both employ an electron beam ion trap for the production of highly charged ion species with the aim of then measuring atomic level lifetimes in the femtosecond range. In one experiment (done by Beiersdorfer et al. some time ago), the lifetime measurement depends on the associated line broadening. In a recent string of experiments at Linac Coherent Light Source Stanford, the HI-LIGHT collaboration employed pump-probe excitation using the FEL as a short-pulse X-ray laser.

Keywords

Light Pulse Electron Bunch High Charge State Intense Light Pulse Level Lifetime 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgment

The author appreciates thankfully the hospitality and support experienced at the Livermore EBIT laboratory and the work experience in the HI-LIGHT collaboration. Part of this work was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344. Support by the German Research Association (DFG) is gratefully acknowledged (Tr171-19).

References

  1. 1.
    M. Roberts, P. Taylor, G.P. Barwood, P. Gill, H.A. Klein, W.R.C. Rowley, Phys. Rev. Lett. 78, 1876 (1997)ADSCrossRefGoogle Scholar
  2. 2.
    J.R. Crespo López-Urrutia, P. Beieresdorfer, K. Widmann, Phys. Rev. A 74, 012507 (2006)ADSCrossRefGoogle Scholar
  3. 3.
    E. Träbert, P.H. Heckmann, von H. Buttlar, Z. Physik A 281, 333 (1977)ADSCrossRefGoogle Scholar
  4. 4.
    H.-D. Betz, F. Bell, H. Panke, G. Kalkoffen, M. Welz, D. Evers, Phys. Rev. Lett. 33, 807 (1974)ADSCrossRefGoogle Scholar
  5. 5.
    S. Mannervik, C. Cederquist, M. Kisielinski, Phys. Scr. T 8, 107 (1984)ADSCrossRefGoogle Scholar
  6. 6.
    E. Träbert, in Accelerator-Based Atomic Physics—Techniques and Applications, ed. by S.M. Shafroth, J.C. Austin, (AIP, Washington, 1997), p. 567Google Scholar
  7. 7.
    E. Träbert, Phys. Scr. T 100, 88 (2002)ADSCrossRefGoogle Scholar
  8. 8.
    E. Träbert, Phys. Scr. 61, 257 (2000)ADSCrossRefGoogle Scholar
  9. 9.
    E. Träbert, Can. J. Phys. 80, 1481 (2002)ADSCrossRefGoogle Scholar
  10. 10.
    E. Träbert, Can. J. Phys. 86, 73 (2008)ADSCrossRefGoogle Scholar
  11. 11.
    E. Träbert, J. Phys. B At. Mol. Opt. Phys. 43, 074034 (2010)ADSCrossRefGoogle Scholar
  12. 12.
    E. Träbert, M. Grieser, J. Hoffmann, C. Krantz, R. Repnow, A. Wolf, Phys. Rev. A 85, 052508 (2012)ADSCrossRefGoogle Scholar
  13. 13.
    E. Träbert, M. Grieser, C. Krantz, R. Repnow, A. Wolf, F.J. Diaz, Y. Ishikawa, J.A. Santana, J. Phys. B At. Mol. Opt. Phys. 45, 215003 (2012)ADSCrossRefGoogle Scholar
  14. 14.
    M.A. Levine, R.E. Marrs, J.R. Henderson, D.A. Knapp, M.B. Schneider, Phys. Scr. T 22, 157 (1988)ADSCrossRefGoogle Scholar
  15. 15.
    M.A. Levine, R.E. Marrs, J.N. Bardsley et al., Nucl. Instrum. Meth. B 43, 431 (1989)ADSCrossRefGoogle Scholar
  16. 16.
    R.E. Marrs, S.R. Elliott, D.A. Knapp, Phys. Rev. Lett. 72, 4082 (1994)ADSCrossRefGoogle Scholar
  17. 17.
    P. Beiersdorfer, L. Schweikhard, J. Crespo López-Urrutia, K. Widmann, Rev. Sci. Instrum. 67, 3818 (1996)ADSCrossRefGoogle Scholar
  18. 18.
    P. Beiersdorfer, B. Beck, St. Becker, L. Schweikhard, Int. J. Mass Spectrom. Ion Proc. 157/158, 149 (1996)ADSCrossRefGoogle Scholar
  19. 19.
    P. Beiersdorfer, Can. J. Phys. 86, 1 (2008)ADSCrossRefGoogle Scholar
  20. 20.
    P. Beiersdorfer, V. Decaux, S.R. Elliott, K. Widmann, K. Wong, Rev. Sci. Instrum. 66, 303 (1995)ADSCrossRefGoogle Scholar
  21. 21.
    P. Beiersdorfer, R.E. Olson, L. Schweikhard, P. Liebisch, G.V. Brown, J.R. Crespo López-Urrutia, C.L. Harris, P.A. Neill, S.B. Utter, K. Widmann, AIP Conf. Proc. 500, 626 (2000)ADSCrossRefGoogle Scholar
  22. 22.
    P. Beiersdorfer, A.L. Osterheld, V. Decaux, K. Widmann, Phys. Rev. Lett. 77, 5353 (1996)ADSCrossRefGoogle Scholar
  23. 23.
    A. Graf, P. Beiersdorfer, C.L. Harris, D.Q. Hwang, P.A. Neill, in CP645, Spectral Line Shapes: Vol. 12, Proceedings of 16th ICSLS, ed. by C.A. Back, (American Institute of Physics, Washington, 2002)Google Scholar
  24. 24.
    W.R. Johnson, D.R. Plante, J. Sapirstein, in Advances of Atomic, Molecular and Optical Physics, Vol. 35, eds. by B. Bederson, H. Walther, (Academic, San Diego, 1995) p.255CrossRefGoogle Scholar
  25. 25.
    P. Beiersdorfer, (private communication)Google Scholar
  26. 26.
    S. Bernitt, G.V. Brown, J.K. Rudolph, R. Steinbrügge, A. Graf, M. Leutenegger, S.W. Epp, S. Eberle, K. Kubicek, V. Mäckel, M.C. Simon, E. Träbert, E.W. Magee, C. Beilmann, N. Hell, S. Schippers, A. Müller, S.M. Kahn, A. Surzhykov, Z. Harman, Ch. Keitel, J. Clementson, F.S. Porter, W.F. Schlotter, J.J. Turner, J. Ullrich, P. Beiersdorfer, J.R. Crespo López-Urrutia, Nature 492(no. 7428), 225 (2012). doi: 10.1038/nature11627 ADSCrossRefGoogle Scholar
  27. 27.
    A. Kramida, Yu. Ralchenko, J. Reader, NIST ASD team, NIST Atomic Spectra Database (ver. 5.0), (Online) (2012). Available: http://physics.nist.gov/asd [2012, October 3]. National Institute of Standards and Technology, Gaithersburg, MD, USA
  28. 28.
    C.J. Fontes, H.-L. Zhang, private communicationGoogle Scholar
  29. 29.
    P. Emma, K. Bane, M. Cornacchia, Z. Huang, H. Schlarb, G. Stupakov, D. Walz, Phys. Rev. Lett. 92, 074801 (2004)ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  1. 1.Astronomisches Institut, Fakultät für Physik und AstronomieRuhr-Universität BochumBochumGermany
  2. 2.Physics Division, Physical and Life SciencesLawrence Livermore National LaboratoryLivermoreUSA

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