Applied Physics B

, Volume 114, Issue 1–2, pp 167–172 | Cite as

Measurement of femtosecond atomic lifetimes using ion traps

  • Elmar TräbertEmail author


Two types of experiment are described that both employ an electron beam ion trap for the production of highly charged ion species with the aim of then measuring atomic level lifetimes in the femtosecond range. In one experiment (done by Beiersdorfer et al. some time ago), the lifetime measurement depends on the associated line broadening. In a recent string of experiments at Linac Coherent Light Source Stanford, the HI-LIGHT collaboration employed pump-probe excitation using the FEL as a short-pulse X-ray laser.


Light Pulse Electron Bunch High Charge State Intense Light Pulse Level Lifetime 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



The author appreciates thankfully the hospitality and support experienced at the Livermore EBIT laboratory and the work experience in the HI-LIGHT collaboration. Part of this work was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344. Support by the German Research Association (DFG) is gratefully acknowledged (Tr171-19).


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Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  1. 1.Astronomisches Institut, Fakultät für Physik und AstronomieRuhr-Universität BochumBochumGermany
  2. 2.Physics Division, Physical and Life SciencesLawrence Livermore National LaboratoryLivermoreUSA

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