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Photothermal diffuse reflectance: a new tool for spectroscopic investigation of scattering samples

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Abstract

A new method named photothermal diffuse reflectance (PTDR) is presented. This method combines the diffuse reflectance spectroscopy with the photothermal technique and is particularly suited for the investigation of strongly scattering samples. This method takes advantage of the high spectral selectivity and absorption of the mid-infrared region with the larger scattering cross section and high detector sensitivity available in the near-infrared. A model describing the PTDR method is proposed and supported with experimental results. The potential of the PTDR technique is illustrated by experimental signals obtained from various scattering media like polymers, liquids and powders.

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Acknowledgments

The financial support by Glucometrix NIB and ETH Zürich is greatly acknowledged.

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Authors and Affiliations

  1. Laser Spectroscopy and Sensing Laboratory, Institute for Quantum Electronics, ETH Zurich, Schafmattstrasse 16, 8093, Zurich, Switzerland

    J. M. Rey, J. Kottman & M. W. Sigrist

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  1. J. M. Rey
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  2. J. Kottman
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  3. M. W. Sigrist
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Correspondence to M. W. Sigrist.

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Rey, J.M., Kottman, J. & Sigrist, M.W. Photothermal diffuse reflectance: a new tool for spectroscopic investigation of scattering samples. Appl. Phys. B 112, 547–551 (2013). https://doi.org/10.1007/s00340-013-5437-y

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  • DOI: https://doi.org/10.1007/s00340-013-5437-y

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