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Lateral resolution of 28 nm (λ /25) in far-field fluorescence microscopy

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Abstract

We demonstrate sub-diffraction lateral resolution of 28±2 nm in far-field fluorescence microscopy through stimulated emission depletion effected by an amplified laser diode. Measurement of the optical transfer function in the focal plane reveals a 6-fold enlargement of the spatial bandwith over the diffraction limit. The resolution is established by imaging individual fluorescent molecules on a surface. Corresponding to 1/25 of the responsible wavelength, the attained resolution represents a new benchmark in far-field microscopy and underscores the viability of fluorescence nanoscopy with visible light, conventional optics and compact laser systems .

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Authors and Affiliations

  1. Max-Planck-Institute for Biophysical Chemistry, Department of NanoBiophotonics, Am Fassberg 11, 37077, Göttingen, Germany

    V. Westphal, L. Kastrup & S.W. Hell

Authors
  1. V. Westphal
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  2. L. Kastrup
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  3. S.W. Hell
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Correspondence to S.W. Hell.

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PACS

32.50.+d; 42.30.-d; 78.45.+h; 87.57.Ce

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Westphal, V., Kastrup, L. & Hell, S. Lateral resolution of 28 nm (λ /25) in far-field fluorescence microscopy. Appl. Phys. B 77, 377–380 (2003). https://doi.org/10.1007/s00340-003-1280-x

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  • DOI: https://doi.org/10.1007/s00340-003-1280-x

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