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Noise as reliability screening for semiconductor lasers

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Abstract.

The low-frequency electrical noise in semiconductor lasers is measured and used for device-reliability screening, which is a sensitive and non-destructive method. In the experiment, we developed some approaches to improve the validity of reliability screening by using noise criteria. A new method of determining the threshold level of noise criteria is given. The experimental results show that this method is effective.

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Authors and Affiliations

  1. Department of Optical Communication, College of Communication Engineering, Jilin University, Changchun 130012, P.R. China, , , , , , CN

    H. Guijun

  2. Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130021, P.R. China, , , , , , CN

    G. Yinbing

  3. College of Electronics Engineering, Jilin University, Changchun 130023, P.R. China, , , , , , CN

    S. Jiawei, Y. Xiaosong & L. Jing

Authors
  1. H. Guijun
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  2. S. Jiawei
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  3. G. Yinbing
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  4. Y. Xiaosong
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  5. L. Jing
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Additional information

Received: 26 September 2002 / Revised version: 28 January 2003 / Published online: 9 April 2003

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ID="*"Corresponding author. Fax: +86-431/462-7013, E-mail: huguijun@sina.com

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Guijun, H., Jiawei, S., Yinbing, G. et al. Noise as reliability screening for semiconductor lasers . Appl Phys B 76, 359–363 (2003). https://doi.org/10.1007/s00340-003-1142-6

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  • DOI: https://doi.org/10.1007/s00340-003-1142-6

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