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Amplified luminescence and threshold current temperature dependencies of ZnSe and GaN laser diodes

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Abstract.

Using a transfer equation approach, it is shown that the cavity-trapped amplified luminescence (AL) flux densities S integrated over the frequency and cavity length at the threshold of ZnSe, zinc-blende and wurtzite GaN laser diodes (LDs) with stripe-geometry bulk active layers reach (3.5–9)×104 MW/m2 within the temperature range 200–400 K. At these values of S, the nonlinear optical effects induced by AL can be observed. The AL induced recombination can enhance the threshold current density of the short wavelength LDs by two or even three times.

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Received: 7 January 2002 / Revised version: 11 April 2002 / Published online: 8 August 2002

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Burov, L., Ryabtsev, G., Smal, A. et al. Amplified luminescence and threshold current temperature dependencies of ZnSe and GaN laser diodes. Appl Phys B 75, 63–66 (2002). https://doi.org/10.1007/s00340-002-0930-8

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  • DOI: https://doi.org/10.1007/s00340-002-0930-8

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