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About the depth sensitivity of second-harmonic radiation in ultra-thin metal films

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Abstract.

Second-harmonic generation (SHG) results for Ni and Co films on Cu (001) have been reinvestigated regarding the depth sensitivity of this technique for thin films. We find that tangential components of the nonlinear susceptibility are much more sensitive to real film properties than normal components, which are confined to surfaces and interfaces. In consequence, for SHG experiments on ultra-thin metal films, polarization combinations should be favored that possess only tangential susceptibility components, even though the yield is weaker. Additional phase measurements are necessary to obtain full information about the film.

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Authors and Affiliations

  1. Fachbereich Physik, Philipps-Universität Marburg, Renthof 5, 35032 Marburg, Germany, DE

    J. Güdde

  2. Research Institute for Materials, Toernooiveld 1, 6525 ED Nijmegen, The Netherlands, NL

    J. Hohlfeld

  3. Fachbereich Physik, Freie Universität Berlin, Arnimallee 14, 14195 Berlin, Germany, DE

    E. Matthias

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  1. J. Güdde
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  2. J. Hohlfeld
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  3. E. Matthias
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Received: 20 January 2002 / Published online: 6 June 2002

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Güdde, J., Hohlfeld, J. & Matthias, E. About the depth sensitivity of second-harmonic radiation in ultra-thin metal films . Appl Phys B 74, 691–695 (2002). https://doi.org/10.1007/s00340-002-0915-7

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  • DOI: https://doi.org/10.1007/s00340-002-0915-7

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