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surface of Si(111) wafers was studied as a function of annealing time at relatively low annealing temperatures (50 and 100 °C) by application of scanning force microscopy. A fast increase in cluster diameter and height as a function of annealing time was detected. After more than 3 h of annealing depletion zones and nucleation exclusion zones were observed.
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Received: 13 August 1998 / Published online: 10 February 1999
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Berlinger, A. Dynamics of gold cluster systems . Appl Phys A 68, 403–405 (1999). https://doi.org/10.1007/s003390050913
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DOI: https://doi.org/10.1007/s003390050913