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Scanning microscopy by mid-infrared near-field scattering

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2

-laser radiation from an AFM tip. In the microscopic images we find and identify a new type of AFM-induced artifact (crosstalk via the tapping amplitude). Minimizing this by proper scan parameters we obtain evidence of true infrared contrast. The results demonstrate the material-sensitive potential of infrared-spectroscopic imaging and a spatial resolving power of better than 100 nm.

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Authors and Affiliations

  1. Max-Planck-Institut für Biochemie, D-82152 Martinsried, Germany (Fax: +49-89/8578-2641, E-mail: knoll@biochem.mpg.de, keilmann@biochem.mpg.de), , , , , , DE

    B. Knoll & F. Keilmann

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  1. B. Knoll
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  2. F. Keilmann
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Received: 18 November 1997/Accepted: 5 January 1998

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Knoll, B., Keilmann, F. Scanning microscopy by mid-infrared near-field scattering . Appl Phys A 66, 477–481 (1998). https://doi.org/10.1007/s003390050699

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  • DOI: https://doi.org/10.1007/s003390050699

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