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Received: 22 November 1996/Accepted: 17 December 1996
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Giesen, M., Phaneuf, R., Williams, E. et al. Characterization of p-n junctions and surface-states on silicon devices by photoemission electron microscopy . Appl Phys A 64, 423–430 (1997). https://doi.org/10.1007/s003390050500
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DOI: https://doi.org/10.1007/s003390050500