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Structural characterization of relaxor ferroelectric PbMg1/3Nb2/3O3-PbTiO3 thin film heterostructures deposited by pulsed laser ablation

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Abstract.

Highly oriented and epitaxial films of relaxor ferroelectric PbMg1/3Nb2/3O3-PbTiO3 (PMN-PT) with a composition (68/32) near the morphotropic phase boundary were deposited by pulsed laser ablation on La0.5Sr0.5CoO3 bottom electrodes, deposited on MgO (100) and LaAlO3 (100). The formation of crystalline phases, epitaxy, film–electrode–substrate orientation relationships and crystal perfection were studied by X-ray diffraction and scanning electron microscopy. The structural properties were found to depend on the deposition conditions and substrate. Correlation of both the dielectric and relaxor properties in the heterostructures and the structural properties of the PMN-PT films was observed.

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Authors and Affiliations

  1. Microelectronics Laboratory and EMPART Research Group of Infotech Oulu, University of Oulu, PL 4500, FIN-90014 Oulun yliopisto, Finland, , , , , , FI

    J. Levoska, M. Tyunina & S. Leppävuori

  2. Institute of Solid State Physics, University of Latvia, 8 Kengaraga, LV-1063 Riga, Latvia, , , , , , LV

    A. Sternberg

Authors
  1. J. Levoska
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  2. M. Tyunina
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  3. A. Sternberg
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  4. S. Leppävuori
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Received: 15 September 1999 / Accepted: 22 November 1999 / Published online: 23 February 2000

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Levoska, J., Tyunina, M., Sternberg, A. et al. Structural characterization of relaxor ferroelectric PbMg1/3Nb2/3O3-PbTiO3 thin film heterostructures deposited by pulsed laser ablation . Appl Phys A 70, 269–274 (2000). https://doi.org/10.1007/s003390050046

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  • DOI: https://doi.org/10.1007/s003390050046

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