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Analysis on the defect states of FAxMA1−xPbI3 perovskite single crystals grown by inverse-temperature crystallization

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Abstract

The FA0.6MA0.4PbI3, FA0.8MA0.2PbI3 and FAPbI3 perovskite single crystals were prepared by the inverse temperature crystallization method. From the deep level transient spectroscopy (DLTS) measurement and optical conduction DLTS, the FA0.6MA0.4PbI3 and FA0.8MA0.2PbI3 samples had the majority carrier defects of E2 and E3 with Ea of 0.52 and 0.59 eV, which were positioned below the conduction band minimum, and the FAPbI3 sample had the minority carrier defect of H2 with Ea of 0.60 eV above the valence band maximum. The origin of the defect states of E2, E3 and H2 are related to FA-I antisite defects, Pb interstitial defects and iodine vacancy, respectively. Among the samples, the defect density (Nt) of H2 on FAPbI3 was lower than that of any other sample, although the normalized integrated photoluminescence intensity of the FA0.8MA0.2PbI3 sample was higher than that of any other sample. This is due to the fact that H2 was a minority carrier defect and E2 and E3 were majority carrier defects.

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Acknowledgements

This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (NRF-2021R1A2C1093652, 2022M3I8A2085434, 2022R1A2C2091945, 2021R1I1A1A01060493).

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KSL: writing—original draft preparation, carrying out measurements; DYP: Formal analysis and investigation, methodology; MSJ: supervision, funding acquisition; EKK: supervision, review and editing, funding acquisition.

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Correspondence to Mun Seok Jeong or Eun Kyu Kim.

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Lee, K.S., Park, D.Y., Jeong, M.S. et al. Analysis on the defect states of FAxMA1−xPbI3 perovskite single crystals grown by inverse-temperature crystallization. Appl. Phys. A 130, 393 (2024). https://doi.org/10.1007/s00339-024-07564-x

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