Abstract
Electrochemical transistors (ECTs) are switches that are controlled by ionic gating, and find emerging applications in electronic devices and chemical sensors. In this paper, we fabricate microscale tungsten oxide (WOx) ECTs and study their subthreshold characteristics. We optimize the film deposition process to produce WOx films with various oxygen concentrations, and investigate their physical and chemical properties. We employ transparent amorphous WO3 films as the channel material for ECTs, and experimentally investigate their subthreshold behaviors by injecting different metal ions in electrolytes. In addition, we explore the dynamic response of the WO3 ECT. Gated by cation intercalation, we find that these WO3 ECTs can obtain a subthreshold slope as low as 60 mV/dec at room temperature, approaching the same thermodynamic limit as field-effect transistors. The material and device strategies provide a route to realizing future computing and sensing devices.
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The data that support the findings of this study are available from the corresponding author (Xing Sheng) upon reasonable request.
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Funding
This work is supported by Tsinghua University Initiative Scientific Research Program (20211080065), Beijing Municipal Natural Science Foundation (Z220015) and National Natural Science Foundation of China (NSFC) (52272277).
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Conceptualization, KZ and XS; methodology, KZ, WZ and XS; writing—original draft preparation, KZ; writing—review and editing, XS; supervision, XS; project administration, XS; funding acquisition, XS. All authors have read and agreed to the published version of the manuscript.
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Zhang, K., Zhao, W. & Sheng, X. Ion-gated tungsten oxide based electrochemical transistors with subthreshold slopes approaching the thermodynamic limit. Appl. Phys. A 129, 728 (2023). https://doi.org/10.1007/s00339-023-07005-1
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DOI: https://doi.org/10.1007/s00339-023-07005-1