Abstract
In this work, the effects of the substrate material on the electrical properties of self-assembled InAs quantum dots (QDs)-based laser structures have been reported. Two InAs QD laser structures with the same active regions deposited on GaAs and Si substrates utilizing strain reducing layer (SRL) containing GaAs/InGaAs have been investigated using current–voltage (I–V), capacitance–voltage, and Deep-Level Transient Spectroscopy (DLTS) techniques. The I–V measurements illustrated that the rectification ratio (IF/IR) and built-in potential (ϕB) for the sample deposited on Si substrate are higher than that of sample deposited on GaAs substrate. However, the series resistance (Rs) of the InAs QDs deposited on Si substrate is lower than that of the InAs QDs deposited on GaAs substrate. The DLTS and Laplace-DLTS measurements showed that the number of traps in InAs QDs/GaAs devices is lower than that in InAs QDs/Si devices, corroborating with I–V results.
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Data sets generated during the current study are available from the corresponding author on reasonable request.
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Acknowledgements
M. Al Huwayz would like to acknowledge the support of “the National Plan for Sciences, Technology and Innovation (MAARIFAH)-King Abdulaziz City for Sciences and Technology (KACST)-Kingdom of Saudi Arabia Award Number: 14-NAN65-08. N. Al Saqri and Y. Al Saleh are thankful for the financial support by Sultan Qaboos University internal grant project IG/SCI/PHYS/20/01.
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MAH: experimental design, carrying out measurements, and manuscript composition. DAJ, SA, SA, AA, NAS, YAlS, AA, and AA: manuscript composition. OML: manuscript composition. AS: MBE growth of samples and manuscript composition. MH: experimental design and manuscript composition.
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Al Huwayz, M., Jameel, D.A., Alotaibi, S. et al. Effects of substrate material on the electrical properties of self-assembled InAs quantum dots-based laser structures. Appl. Phys. A 129, 405 (2023). https://doi.org/10.1007/s00339-023-06626-w
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DOI: https://doi.org/10.1007/s00339-023-06626-w