Abstract
The Cu2ZnSnS4 (CZTS) thin films are prepared by dip-coating technique. The prepared thin films showed perfect stoichiometry and phase with a tetragonal unit cell. The scanning electron microscopy of the surface and electron diffraction showed the uniform spread of the film with the presence of fringes, respectively. The fringe width matches the inter-planner spacing of the CZTS (112) major plane. The thin film showed an optical bandgap of direct nature having a value of 1.5 eV. The analysis by Raman confirmed the CZTS phase of the prepared thin film. The CZTS thin film/Ag-paste/Cu-wire combination is studied for photoresponse for three monochromatic incident photon wavelengths. The evaluated photoresponse parameters stated the as-prepared CZTS thin film has the potential for future applications.
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The data generated during the current study are available from the corresponding author upon reasonable request.
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Acknowledgements
One of the authors, ABH, is thankful to the Department of Science and Technology (DST), Technology Bhawan, New Mehrauli Road, New Delhi-110016 for the award of INSPIRE Fellowship (IF180246) to carry out this research work. All the authors are thankful to the Materials Research Centre, MNIT Jaipur, India for the XPS analysis of the sample.
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ABH participated in the conceptualization, material preparation, data collection, investigation, analysis, and writing of the original draft. SHC acquired resources and assisted in project administration, reviewing, and editing of the manuscript, and supervision. RMK participated in the investigation and methodology. MPD assisted in project administration.
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Hirpara, A.B., Chaki, S.H., Kannaujiya, R.M. et al. Photoresponse application of the dip-coated Cu2ZnSnS4 thin film. Appl. Phys. A 129, 226 (2023). https://doi.org/10.1007/s00339-023-06507-2
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DOI: https://doi.org/10.1007/s00339-023-06507-2