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Intensity and wavelength-dependent two-photon absorption and its saturation in ITO film

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Abstract

Third-order nonlinear optical (NLO) properties of indium tin oxide (ITO) thin film were studied using high repetition rate (80 MHz), femtosecond (100 fs), and near-infrared (NIR) (750–820 nm) laser pulses. An ITO thin film was prepared using an RF magnetron sputtering system. The film thickness was determined using a scanning electron microscope (SEM), while the linear optical properties of the thin film were measured using a UV–Vis spectrophotometer. Nonlinear absorption (NLA) studies of ITO thin film using an open aperture Z-scan revealed a combination of nonlinear phenomena: reverse saturable absorption (RSA) and saturable absorption (SA). A saturation model has been used to explain the observed saturation of two-photon absorption (2PA) at high incident powers. The ITO film's NLA properties were found to be excitation power and wavelength dependent. The NLA coefficient was shown to be inversely proportional to the excitation power and wavelength. Furthermore, NLA measurements of ITO thin films show that the transition from RSA to RSA-SA-RSA switching behavior was influenced by ITO thickness. Because of their high third-order nonlinear optical responses, these ITO thin films are ideal candidates for photonic applications.

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Data availability

The data that support the findings of this study are available from the corresponding author upon reasonable request.

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Acknowledgements

This study was supported by a Science and Technology Development Fund (STDF) through the Basic Sciences Research Program (30147).

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Authors and Affiliations

  1. Laser Institute for Research and Applications LIRA, Beni-Suef University, Beni-Suef, 62511, Egypt

    Fatma Abdel Samad & Tarek Mohamed

  2. Department of Engineering, Faculty of Advanced Technology and Multidiscipline, Universitas Airlangga, Gubeng, Indonesia

    Tarek Mohamed

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  1. Fatma Abdel Samad
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Samad, F.A., Mohamed, T. Intensity and wavelength-dependent two-photon absorption and its saturation in ITO film. Appl. Phys. A 129, 31 (2023). https://doi.org/10.1007/s00339-022-06259-5

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