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Spectroscopic ellipsometry characterization of amorphous Se100-xTex films using the Cody–Lorentz parameterized model

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Abstract

The optical properties of a series of Se100-xTex (x = 0, 1, 5, 10, 15, 20, 25 and 35) films have been determined using a variable angle spectroscopic ellipsometer in the photon energies range of 1–5 eV. Se100-xTex films were prepared by conventional vacuum deposition. The dielectric functions of this series are parameterized using a dielectric function model that applies two Cody–Lorentz (CL) and one Harmonic oscillator models. This parameterization scan is performed positively to define the changes in the optical properties with Te content. Lorentz oscillator amplitude (Afun), oscillator width (C fun), the extent of broadening Eu fun and transition energy (Ep fun) of the prepared films are enhanced with increasing Te content. While the CL peak transition energy (Eo fun) and optical energy gap are gradually decreased as Te content is increased.

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Acknowledgements

Authors thank Taif University Researchers Supporting Project number (TURSP-2020/12), Taif University, Taif, Saudi Arabia

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Authors and Affiliations

  1. Physics Department, Faculty of Science, University of Aswan, Aswan, Egypt

    F. Abdel-Wahab & M. M. Mahasen

  2. Department of Physics, College of Science, Taif University, P.O. Box 11099, Taif, 21944, Saudi Arabia

    Ali Badawi & A. A. F. Al-yami

  3. Department of Physics, University College of Turabah, Taif University, P.O. Box 11099, Taif, 21944, Saudi Arabia

    Ali Badawi

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  1. F. Abdel-Wahab
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  2. Ali Badawi
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  3. A. A. F. Al-yami
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Correspondence to F. Abdel-Wahab or Ali Badawi.

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Abdel-Wahab, F., Badawi, A., Al-yami, A.A.F. et al. Spectroscopic ellipsometry characterization of amorphous Se100-xTex films using the Cody–Lorentz parameterized model. Appl. Phys. A 127, 531 (2021). https://doi.org/10.1007/s00339-021-04681-9

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