Abstract
Zinc oxide (ZnO) thin films were deposited onto glass substrates by a spray pyrolysis technique at the substrate temperatures (T S) between 250 and 500 °C. T S was observed to be one of the key parameters to influence the structural, surface morphological, optical and transport properties of ZnO thin films. X-ray diffraction patterns of the ZnO thin films showed polycrystalline hexagonal wurtzite structure and the preferred orientation was along (002) plane which got more prominent with the increase of T S. Field emission scanning electron microscopy of ZnO thin films showed the existence of nanofibers in the films with the average thickness ranging from 308 to 540 nm. Atomic force microscopy revealed that roughness of the ZnO thin film increased at higher T S. ZnO thin films were highly transparent in the visible to near infrared region with the maximum transmittance of 89% and the optical band gap was found from 3.23 to 3.31 eV. ZnO thin films showed n-type conductivity with the carrier concentrations ranging between 1019 and 1020 cm− 3. ZnO thin film deposited at the T S of 400 °C showed the highest mobility, highest carrier concentration and less resistivity.
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Z.R. Khan, M.S. Khan, M. Zulfequar, M.S. Khan, Mater. Sci. Appl. 2, 340–345 (2011)
C.G. A.Janotti, Van de Walle, Rep. Prog. Phys. 72, 126501 (2009) (1–29)
A.K. Radzimska, T. Jesionowski, Materials 7, 2833 (2014)
S. Nakamura, G. Fasol, The Blue Laser Diode. (Springer, Berlin, 1997)
D.M. Bagnall, Y.F. Chen, Z. Zhu, T. Yao, S. Koyama, M.Y. Shen, T. Goto, Appl. Phys. Lett. 70, 2230–2232 (1997)
B. Tripathi, M. Patel, A. Ray, M. Kumar, IOP Conf. Series Mater. Sci. Eng. 43, 012002 (2013) (1–5)
L. Nádherný, Z. Sofer, D. Sedmidubský, O. Jankovský, M. Mikulics, Ceram. Silik. 56(2), 117–121 (2012)
M. Alexiadou, M. Kandyla, G. Mousdis, M. Kompitsas, Appl. Phys. A (2017). https://doi.org/10.1007/s00339-017-0900-y
K.K. Kim, J.H. Song, H.J. Jung, S.J. Park, J. Appl. Phys. 87, 3573–3575 (2000)
T. Nagase, T. Ooie, Y. Nakatsuka, K. Shinozaki, N. Mizutani, Jpn. J. Appl. Phys. 39, L713–L715 (2000)
Y.F. Chen, H.J. Ko, S.K. Hong, K. Inaba, Y. Segawa, T. Yao, J. Cryst. Growth 227–228, 917–922 (2001)
M. A.Yamada, Konagai, Sol. Stat. Phenom. 67(8), 237–248 (1999)
N.L. Tarwal, V.V. Shinde, A.S. Kamble, P.R. Jadhav, D.S. Patil, V.B. Patil, P.S. Patil, Appl. Surf. Sci. 257, 10789–10794 (2011)
R. Ayouchi, F. Martin, D. Leinen, J.R.R. Barrado, J. Cryst. Growth 247, 497–504 (2003)
T.A. Ma, S.H. Kim, H.Y. Moon, G.C. Park, Y.J. Kim, K.W. Kim, Jpn. J. Appl. Phys. 35, 6208–6211 (1996)
Y. Larbah, M. Adnane, T. Sahraoui, Mater. Sci. Pol. 33, 491–496 (2015)
A.S. Enigochitra, P. Perumal, C. Sanjeeviraja, D. Deivamani, M. Boomashri, Superlattices Microstruct. 90, 313–320 (2016)
F. Zahedi, R.S. Dariani, S.M. Rozati, Mat. Sci. Semicon. Proc. 16, 245–249 (2013)
S. Tolansky, Multiple Beam Interferometry of Surfaces and Films. (Oxford Clarendon Press, London, 1948)
C. Barret, T.B. Massalski, Structure of Metals, (Oxford, Pergamon, 1980)
C. Kittel, Introduction to Solid State Physics. (Wiley, New York, 1976)
P. Scherrer, P. Bestimmung der Grösse und der inneren Struktur von Kolloidteilchen mittels Röntgensrahlen. Nachr Ges Wiss Goettingen Math-Phys Kl 1918, 98–100 (1918)
Y. Zhao, J. Zhang, J. Appl. Cryst. 41, 1095–1108 (2008)
G.K. Williamson, R.E. Smallman, Philos. Magn. 1(1), 34–46 (1956)
A.D. Sathe, E.S. Kim, In: Proceeding The 7th International Conference on Solid State Sensors and Actuators Transducers, Yokohoma, Japan, pp 158–161, (1993)
H. Landolt, R. Börnstein, Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology, vol. 2 (Springer, Berlin, 1946)
H. Afify, S.A. Nasser, S.E. Demian, J. Mater. Sci. Mater. Electron. 2, 152–156 (1991)
M.H. Choi, Y. Ma, J. Mater. Sci. 41, 431–435 (2006)
M.R. Islam, J. Podder, Cryst. Res. Technol. 44(3), 286–292 (2009)
N.S. Kumar, K.V. Bangera, G.K. Shivakumar, Appl. Nanosci. 4, 209–216 (2014)
T.P. Rao, M.C.S. Kumar, A. Safarulla, V. Ganesan, S.R. Barman, C. Sanjeeviraja, Phys. B 405, 2226–2231 (2010)
R.E. Hummel, Electronic Properties of Materials, 3rd edn. (Springer, New York, 2000)
X.W. Sun, H.S. Kwok, J. Appl. Phys. 86(1), 408–411 (1999)
N. Shakti, P.S. Gupta, Appl. Phys. Res. 2(1), 19–28 (2010)
E.A. Davies, N.F. Mott, Philos. Magn. 22, 903–922 (1970)
S. A.Rahal, B. Benramache, Benhaoua, Eng. J Canada 18(2), 81–88 (2014)
I.Y. Erdogan, J. Alloys Compd. 502, 445–450 (2010)
W.D. Callister Jr., Fundamentals of Materials Science and Engineering, 5th edn. (Wiley, New York, 2001)
S. Cho, Trans. Electr. Electron. Mater. 10(6), 185–188 (2009)
Y. Zheng, X. Zeng, X. Sun, D. Huang, Front. Optoelectron 6(3), 270–274 (2013)
L.L. Kazmerski, Polycrystalline and Amorphous Thin Films and Devices. (Academic Press, New York, 1980)
M. Smirnov, A.P. Rambu, C. Baban, G.I. Rusu, J. Adv. Res. Phys. 1(2), 021011 (2010) (1–4)
A.E.J. Gonzalez, J.A.S. Urueta, R.S. Parra, J. Cryst. Growth 192, 430–438 (1998)
S.K. Saha, M.A. Rahman, M.R.H. Sarkar, M. Shahjahan, M.K.R. Khan, J. Semicond. 36(3), 033004-1–033004-6 (2015)
S. Tewari, A. Bhattacharjee, Pramana J. Phys. 76(1), 153–163 (2011)
Acknowledgements
The authors are grateful to the authority of BUET for financial support and Material Science Division, Atomic energy Center, Dhaka, Bangladesh, for providing necessary laboratory support to this research work. The authors are thankful to Prof. Dr. Jiban Podder, Department of Physics, BUET for fruitful discussion.
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Sharmin, M., Bhuiyan, A.H. Influence of substrate temperature on the properties of spray deposited nanofibrous zinc oxide thin films. Appl. Phys. A 124, 57 (2018). https://doi.org/10.1007/s00339-017-1473-5
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DOI: https://doi.org/10.1007/s00339-017-1473-5