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Studies on strain relaxation of La0.5Ba0.5MnO3 film by normal and grazing incidence X-ray diffraction

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Abstract

Perovskite manganite La0.5Ba0.5MnO3 (LBMO) films were deposited on (001)-oriented single-crystal SrTiO3 (STO) substrates by pulsed laser deposition. High-resolution X-ray diffraction and grazing incidence X-ray diffraction techniques were applied to characterize the crystal structure and lattice strain of LBMO films. The in-plane and out-of-plane growth orientations of LBMO films with respect to substrate surface have been studied. The epitaxial orientation relationship LBMO (001) [100] //STO (001) [100] exists at the LBMO/STO interface. The lattice strain of LBMO film begins to relax with the thickness of LBMO film up to 12 nm. When the thickness is further increased up to 43 nm, the film is in fully strain-relaxed state. Jahn–Teller strain plays an important role in LBMO/STO system. The mechanism for strain relaxation is in accordance with that of tetragonal distortion.

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Acknowledgements

This work was supported by the National Natural Science Foundation of China (Grant Nos. 11604067, U1332106). We would like to thank colleagues from Beijing Synchrotron Radiation Facility and Shanghai Synchrotron Radiation Facility for their help in XRD experiments.

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Authors and Affiliations

  1. Institute of Materials Physics, Hangzhou Dianzi University, Hangzhou, 310018, China

    Haiou Wang

  2. College of Communication and Electronic Engineering, Hunan City University, Yiyang, 413002, China

    Weishi Tan

  3. Key Laboratory of Soft Chemistry and Functional Materials, Department of Applied Physics, Ministry of Education, Nanjing University of Science and Technology, Nanjing, 210094, China

    Weishi Tan, Mengxiong Cao, Xingyu Wang & Chunlin Ma

  4. Department of Electronic and Communication Engineering, Suzhou Institute of Industrial Technology, Suzhou, 215104, China

    Hao Liu

  5. Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing, 100039, China

    Quanjie Jia

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  1. Haiou Wang
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  2. Weishi Tan
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Correspondence to Haiou Wang or Weishi Tan.

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Wang, H., Tan, W., Liu, H. et al. Studies on strain relaxation of La0.5Ba0.5MnO3 film by normal and grazing incidence X-ray diffraction. Appl. Phys. A 123, 206 (2017). https://doi.org/10.1007/s00339-017-0795-7

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