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Applied Physics A

, 122:445 | Cite as

A model for direct laser interference patterning of ZnO:Al - predicting possible sample topographies to optimize light trapping in thin-film silicon solar cells

  • Tobias DyckEmail author
  • Stefan Haas
Article

Abstract

We present a novel approach to obtaining a quick prediction of a sample’s topography after the treatment with direct laser interference patterning (DLIP) . The underlying model uses the parameters of the experimental setup as input, calculates the laser intensity distribution in the interference volume and determines the corresponding heat intake into the material as well as the subsequent heat diffusion within the material. The resulting heat distribution is used to determine the topography of the sample after the DLIP treatment . This output topography is in good agreement with corresponding experiments. The model can be applied in optimization algorithms in which a sample topography needs to be engineered in order to suit the needs of a given device. A prominent example for such an application is the optimization of the light scattering properties of the textured interfaces in a solar cell.

Keywords

Laser Process Heat Diffusion Laser Pulse Duration Threshold Fluence Spatial Periodicity 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

The authors want to thank Gunnar Schöpe, Andreas Bauer and Pascal Foucart for technical assistance, Bugra Turan, Nicolas Sommer and Uwe Rau for fruitful discussions and the European Union as well as the state of North Rhine-Westphalia for financial funding (Project LATEXT EN3003/B).

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Copyright information

© Springer-Verlag Berlin Heidelberg 2016

Authors and Affiliations

  1. 1.IEK5 - PhotovoltaikForschungszentrum Jülich GmbHJülichGermany
  2. 2.4JET microtech GmbH & Co.KGAlsdorfGermany

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