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Pigment particles analysis with a total reflection X-ray fluorescence spectrometer: study of influence of instrumental parameters

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Abstract

Total reflection X-ray fluorescence (TXRF) analysis is an excellent tool to determine major, minor and trace elements in minuscule amounts of samples, making this technique very suitable for pigment analysis. Collecting minuscule amounts of pigment material from precious works of art by means of a cotton swab is a well-accepted sampling method, but poses specific challenges when TXRF is to be used for the characterization of the unknown material.

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Acknowledgements

The authors thank Ghent University for its financial support through the concerted research actions (GOA) programme. Sylvia Lycke is also acknowledged for the support in the laboratory.

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Authors and Affiliations

  1. Department of Archaeology, Ghent University, Sint-Pietersnieuwstraat 35, 9000, Ghent, Belgium

    Alessia Coccato & Peter Vandenabeele

  2. Department of Analytical Chemistry, Ghent University, Krijgslaan 281, S12, 9000, Ghent, Belgium

    Bart Vekemans, Laszlo Vincze & Luc Moens

Authors
  1. Alessia Coccato
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  2. Bart Vekemans
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  3. Laszlo Vincze
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  4. Luc Moens
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  5. Peter Vandenabeele
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Correspondence to Alessia Coccato.

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Coccato, A., Vekemans, B., Vincze, L. et al. Pigment particles analysis with a total reflection X-ray fluorescence spectrometer: study of influence of instrumental parameters. Appl. Phys. A 122, 1051 (2016). https://doi.org/10.1007/s00339-016-0581-y

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