Abstract
This study focused on the characterization and properties of transparent and conductive indium tin oxide (ITO) thin films deposited in argon atmosphere. ITO thin films were coated onto glass substrates by radio frequency (RF) magnetron sputtering technique at 75 and 100 W RF powers. Structural characteristics of producing films were investigated through X-ray diffraction analysis. UV–Vis spectrophotometer and interferometer were used to determine transmittance, absorbance and reflectance values of samples. The surface morphology of the films was characterized by atomic force microscope. The calculated band gaps were 3.8 and 4.1 eV for the films at 75 and 100 W, respectively. The effect of RF power on crystallinity of prepared films was explored using mentioned analysis methods. The high RF power caused higher poly crystallinity in the produced samples. The thickness and refractive index values for all samples increased respect to an increment of RF power and were calculated as 20, 50 nm and 1.71, 1.86 for samples at 75 and 100 W, respectively. Finally, the estimated grain sizes for all prepared films decreased with increasing of 2θ degrees, and the number of crystallite per unit volume was calculated. It was found that nearly all properties including sheet resistance and resistivity depend on the RF power.
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References
T. Minami, Present status of transparent conducting oxide thin-film development for indium-tin-oxide (ITO) substitutes. Thin Solid Films 516, 5822–5828 (2008)
Y.-H. Tak, K.-B. Kim, H.-G. Park, K.-H. Lee, J.-R. Lee, Criteria for ITO (indium-tin-oxide) thin film as the bottom electrode of an organic light emitting diode. Thin Solid Films 411, 12–16 (2002)
L. Álvarez-Fraga, F. Jiménez-Villacorta, J. Sánchez-Marcos, A. de Andrés, C. Prieto, Indium-tin oxide thin films deposited at room temperature on glass and PET substrates: optical and electrical properties variation with the H2–Ar sputtering gas mixture. Appl. Surf. Sci. 344, 217–222 (2015)
G. Zhu, D. Yan, H. Xu, A. Yu, Structural and electric properties of BaSn0.15Ti0.85O3 films on ITO/glass substrate by RF sputtering from powder target. Mater. Lett. 140, 155–157 (2015)
H.-M. Kim, K. Bae, S. Sohn, Electronic and optical properties of indium zinc oxide thin films prepared by using nanopowder target. Jpn. J. Appl. Phys. 50, 045801 (2011)
D. Dong, W. Wang, G. Dong, Y. Zhou, Z. Wu, M. Wang, F. Liu, X. Diao, Electrochromic properties of NiOx:H films deposited by DC magnetron sputtering for ITO/NiOx:H/ZrO2/WO3/ITO device. Appl. Surf. Sci. 357, 799–805 (2015)
R. Mechiakh, N.B. Sedrine, R. Chtourou, Sol–gel synthesis, characterization and optical properties of mercury-doped TiO2 thin films deposited on ITO glass substrates. Appl. Surf. Sci. 257, 9103–9109 (2011)
J.-H. Park, T. Sudarshan, Chemical Vapor Deposition (ASM İnternational, Materials Park, 2001)
K. Vijayalakshmi, A. Renitta, K. Karthick, Growth of high quality ZnO:Mg films on ITO coated glass substrates for enhanced H2 sensing. Ceram. Int. 40, 6171–6177 (2014)
M. Oikawa, K. Toda, Preparation of Pb (Zr, Ti) O3 thin films by an electron beam evaporation technique. Appl. Phys. Lett. 29, 491–492 (1976)
T. Yong, T. Tou, R. Yang, B. Teo, H. Yow, Properties of ITO on plastics and glass by Nd:YAG laser deposition at 355 and 532nm. Vacuum 82, 1445–1448 (2008)
B. Yao, Y. Chan, N. Wang, Formation of ZnO nanostructures by a simple way of thermal evaporation. Appl. Phys. Lett. 81, 757–759 (2002)
N.E. Çetin, Ş. Korkmaz, S. Elmas, N. Ekem, S. Pat, M.Z. Balbağ, E. Tarhan, S. Temel, M. Özmumcu, The structural, optical and morphological properties of CaF 2 thin films by using thermionic vacuum arc (TVA). Mater. Lett. 91, 175–178 (2013)
V. Şenay, S. Pat, Ş. Korkmaz, T. Aydoğmuş, S. Elmas, S. Özen, N. Ekem, M.Z. Balbağ, ZnO thin film synthesis by reactive radio frequency magnetron sputtering. Appl. Surf. Sci. 318, 2–5 (2014)
P. Canhola, N. Martins, L. Raniero, S. Pereira, E. Fortunato, I. Ferreira, R. Martins, Role of annealing environment on the performances of large area ITO films produced by rf magnetron sputtering. Thin Solid Films 487, 271–276 (2005)
I. Baıa, M. Quintela, L. Mendes, P. Nunes, R. Martins, Performances exhibited by large area ITO layers produced by rf magnetron sputtering. Thin Solid Films 337, 171–175 (1999)
A. Purohit, S. Chander, S. Nehra, C. Lal, M. Dhaka, Effect of thickness on structural, optical, electrical and morphological properties of nanocrystalline CdSe thin films for optoelectronic applications. Opt. Mater. 47, 345–353 (2015)
A. Purohit, S. Chander, A. Sharma, S. Nehra, M. Dhaka, Impact of low temperature annealing on structural, optical, electrical and morphological properties of ZnO thin films grown by RF sputtering for photovoltaic applications. Opt. Mater. 49, 51–58 (2015)
S. Pat, Ş. Korkmaz, S. Özen, V. Şenay, Direct and fast growth of GaAs thin films on glass and polyethylene terephthalate substrates using a thermionic vacuum arc. J. Mater. Sci. Mater. Electron. 26, 2210–2214 (2015)
V. Senthilkumar, P. Vickraman, M. Jayachandran, C. Sanjeeviraja, Structural and optical properties of indium tin oxide (ITO) thin films with different compositions prepared by electron beam evaporation. Vacuum 84, 864–869 (2010)
S. Pat, Ş. Korkmaz, M.Z. Balbağ, A new deposition technique using reactive thermionic vacuum arc for ZnO thin film production. J. Nanoelectron. Optoelectron. 9, 437–441 (2014)
L. Raniero, I. Ferreira, A. Pimentel, A. Goncalves, P. Canhola, E. Fortunato, R. Martins, Role of hydrogen plasma on electrical and optical properties of ZGO, ITO and IZO transparent and conductive coatings. Thin Solid Films 511, 295–298 (2006)
H. Hartnagel, A. Dawar, A. Jain, C. Jagadish, Semiconducting Transparent Thin Films (Institute of Physics, Bristol, 1995)
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Yudar, H.H., Korkmaz, Ş., Özen, S. et al. Surface and optical properties of indium tin oxide layer deposition by RF magnetron sputtering in argon atmosphere. Appl. Phys. A 122, 748 (2016). https://doi.org/10.1007/s00339-016-0262-x
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DOI: https://doi.org/10.1007/s00339-016-0262-x