Applied Physics A

, Volume 121, Issue 4, pp 1383–1387 | Cite as

Non-scanning optical near-field microscopy for nanophotonic security

  • Naoya Tate
  • Makoto Naruse
  • Tsutomu Matsumoto
  • Morihisa Hoga
  • Yasuyuki Ohyagi
  • Shumpei Nishio
  • Wataru Nomura
  • Motoichi Ohtsu
Invited Paper


We propose a novel method for observing and utilizing nanometrically fluctuating signals due to optical near-field interactions between a probe and target in near-field optical microscopy. Based on a hierarchical structure of the interactions, it is possible to obtain signals that represent two-dimensional spatial patterns without requiring any scanning process. Such signals reveal individual features of each target, and these features, when appropriately extracted and defined, can be used in security applications—an approach that we call nanophotonic security. As an experimental demonstration, output signals due to interactions between a SiO2 probe and Al nanorods were observed by using near-field optical microscopy at a single readout point, and these signals were quantitatively evaluated using an algorithm that we developed for extracting and defining features that can be used for security applications.


Artifact Metrics Scanning Process Security Application Molecular Attraction Physical Unclonable Function 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


  1. 1.
    R.L. van Renesse, Optical Document Security (Artech, Morristown, 1994)Google Scholar
  2. 2.
    H. Matsumoto, T. Matsumoto, IPSJ J. 44, 1991–2001 (2003)Google Scholar
  3. 3.
    D. Lim, J.W. Lee, B. Gassend, G.E. Suh, M. van Dijk, S. Devadas, IEEE T. VLSI Syst. 13, 1200–1205 (2005)CrossRefGoogle Scholar
  4. 4.
    G. DeJean, K. Darko, Lect. Notes Comput. Sci. 4727, 346–363 (2007)CrossRefGoogle Scholar
  5. 5.
    J.D. Buchanan, R.P. Cowburn, A.V. Jausovec, D. Petit, P. Seem, G. Xiong, M.T. Bryan, Nature 436, 475 (2005)CrossRefADSGoogle Scholar
  6. 6.
    M. Yamakoshi, J. Tanaka, M. Furuie, M. Hirabayashi, T. Matsumoto, Proc. SPIE 6819, 68190H-1–68190H-10 (2008)CrossRefGoogle Scholar
  7. 7.
    T. Ikeda, S. Hiroe, T. Yamada, T. Matsumoto, Y. Takemura, 3rd International Conference on Anti-counterfeiting, Security, and Identification in Communication 2009, pp. 382–385 (2009)Google Scholar
  8. 8.
    R. Pappu, B. Recht, J. Taylor, N. Gershenfeld, Science 297, 2026–2030 (2002)CrossRefADSGoogle Scholar
  9. 9.
    T. Matsumoto, in Proceedings of the IEICE Symposium on Cryptography and Information Security, SCIS 97-19C (1997)Google Scholar
  10. 10.
    K. Kobayashi, S. Sangu, H. Ito, M. Ohtsu, Near-field optical potential for a neutral atom. Phys. Rev. A 63, 013806 (2001)CrossRefADSGoogle Scholar
  11. 11.
    M. Ohtsu, K. Kobayashi, Optical Near Fields (Springer, Berlin, 2004)CrossRefGoogle Scholar
  12. 12.
    Y. Tanaka, K. Kobayashi, Spatial localization of an optical near field in one-dimensional nanomaterial system. Phys. E 40(2), 297–300 (2007)MathSciNetCrossRefGoogle Scholar
  13. 13.
    M. Ohtsu, Dressed Photons—Concepts of Light-Matter Fusion Technology (Springer, Berlin, 2013)Google Scholar
  14. 14.
    M. Naruse, H. Hori, K. Kobayashi, M. Ishikawa, K. Leibnitz, M. Murata, N. Tate, M. Ohtsu, J. Opt. Soc. Am. B 26(9), 1772–1779 (2009)CrossRefADSGoogle Scholar
  15. 15.
    E. Candès, J. Romberg, T. Tao, IEEE Trans. Inf. Theory 52, 489–509 (2006)zbMATHCrossRefGoogle Scholar
  16. 16.
    D. Donoho, IEEE Trans. Inf. Theory 52, 1289–1306 (2006)zbMATHMathSciNetCrossRefGoogle Scholar
  17. 17.
    J. Haupt, R. Nowak, IEEE Trans. Inf. Theory 52, 4036–4048 (2006)zbMATHMathSciNetCrossRefGoogle Scholar
  18. 18.
    E. Rosten, T. Drummond, in European Conference on Computer Vision, pp. 430–443 (2006)Google Scholar
  19. 19.
    C. Harris, M. Stephens, in Alvey Vision Conference, pp. 147–151 (1988)Google Scholar
  20. 20.
    S.M. Smith, J.M. Brady, Int. J. Comput. Vision 23, 45–78 (1997)CrossRefGoogle Scholar
  21. 21.
    D.G. Lowe, in International Conference on Computer Vision, pp. 1150–1157 (1999)Google Scholar
  22. 22.
    Y. Pihosh, I. Turkevych, J. Ye, M. Goto, A. Kasahara, M. Kondo, M. Tosa, ECS Trans. 16(5), 49–58 (2009)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2015

Authors and Affiliations

  1. 1.Faculty of Information Science and Electrical EngineeringKyushu UniversityFukuokaJapan
  2. 2.Photonic Network Research InstituteNational Institute of Information and Communications TechnologyKoganeiJapan
  3. 3.Graduate School of Environment and Information SciencesYokohama National UniversityYokohamaJapan
  4. 4.Dai Nippon Printing Co. Ltd.KashiwaJapan
  5. 5.Department of Electrical Engineering and Information SystemsThe University of TokyoTokyoJapan

Personalised recommendations