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Leonardo da Vinci’s drapery studies: characterization of lead white pigments by µ-XRD and 2D scanning XRF

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Abstract

This work focuses on the composition and microstructure of the lead white pigment employed in a set of paintworks, using a combination of µ-XRD and 2D scanning XRF, directly applied on five drapery studies attributed to Leonardo da Vinci (1452–1519) and conserved in the Département des Arts Graphiques, Musée du Louvre and in the Musée des Beaux-Arts de Rennes. Trace elements present in the composition as well as in the lead white highlights were imaged by 2D scanning XRF. Mineral phases were determined in a fully noninvasive way using a special µ-XRD diffractometer. Phase proportions were estimated by Rietveld refinement. The analytical results obtained will contribute to differentiate lead white qualities and to highlight the artist’s technique.

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Acknowledgments

We thank Xavier Salmon, Director of the Département des Arts Graphiques of the Musée du Louvre for having authorized the study of Leonardo’s Draperies studies. We are indebted to Louis Frank, Head Curator at the Musée du Louvre for his constant support. We are grateful to Anne Dary, Director of the Musée des Beaux-Arts de Rennes, and Guillaume Kazerouni, Curator, for encouraging the investigation of the draperies.

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Authors and Affiliations

  1. Centre de Recherche et de Restauration des Musées de France, C2RMF, Palais du Louvre, 75001, Paris, France

    Victor Gonzalez, Thomas Calligaro, Laurent Pichon & Bruno Mottin

  2. PSL Research University, Chimie ParisTech-CNRS, Institut de Recherche de Chimie Paris, UMR8247, 75005, Paris, France

    Victor Gonzalez, Thomas Calligaro & Gilles Wallez

  3. Sorbonne University, UPMC Univ., Paris 06, France

    Gilles Wallez

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  1. Victor Gonzalez
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  2. Thomas Calligaro
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  3. Laurent Pichon
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  4. Gilles Wallez
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  5. Bruno Mottin
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Correspondence to Victor Gonzalez.

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Gonzalez, V., Calligaro, T., Pichon, L. et al. Leonardo da Vinci’s drapery studies: characterization of lead white pigments by µ-XRD and 2D scanning XRF. Appl. Phys. A 121, 849–856 (2015). https://doi.org/10.1007/s00339-015-9365-z

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  • DOI: https://doi.org/10.1007/s00339-015-9365-z

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