Abstract
We report optical parallel nanolithography using bowtie apertures with the help of the interferometric-spatial-phase-imaging (ISPI) technique. The ISPI system can detect and control the distance between the bowtie aperture, and photoresist with a resolution of sub-nanometer level. It overcomes the difficulties brought by the light divergence of bowtie apertures. Parallel nanolithography with feature size of 22 ± 5 nm is achieved. This technique combines high resolution, parallel throughput, and low cost, which is promising for practical applications.
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Acknowledgments
Support to this work by the Defense Advanced Research Projects Agency (Grant No. N66001-08-1-2037) and the National Science Foundation (Grant No. CMMI-1120577) is gratefully acknowledged. X.W. also acknowledges the support from the National Basic Research Program (973 Program) of China under Grant No. 2013CBA01703 and 2012CB921900.
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Wen, X., Traverso, L.M., Srisungsitthisunti, P. et al. Optical nanolithography with λ/15 resolution using bowtie aperture array. Appl. Phys. A 117, 307–311 (2014). https://doi.org/10.1007/s00339-014-8265-y
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DOI: https://doi.org/10.1007/s00339-014-8265-y