Abstract
It was found that by changing the substrate temperature from room temperature to ∼850 °C, ZnO thin films with widely varying resistivity values could be grown on sapphire substrates using DC-discharge-assisted pulsed laser deposition (PLD) in oxygen ambient. The resistivity of the film grown at room temperature was too high to measure using our existing setup. However, as the growth temperature was increased from 550 °C to 750 °C, the resistivity first decreased slowly from ∼14.0 to 4.4 Ω m and then dropped suddenly to get saturated at ∼2.0×10−3 Ω m as the growth temperature was further increased. In contrast to these, when there was no DC-discharge, the variation of resistivity for ZnO thin films grown by PLD was marginal up to the substrate temperature of ∼850 °C. The reason for these observations was found to be the combined effects of reduction in donor defect densities like oxygen vacancies and zinc interstitials, introduction of acceptor type defects like interstitial oxygen and zinc vacancies, and the resultant poor carrier mobility at lower growth temperatures. At higher growth temperatures (800 °C and above), the appearance of oxygen vacancies and increase in mobility due to better crystalline quality were found to be responsible for reducing the resistivity. The PL of these films had significant emission in the green and red regions of the spectrum due to the aforesaid defect related transitions. Such highly resistive and luminescent films might be suited for applications such as resistive RAM, UV-photo detector, TFT, piezoelectric, transparent phosphor, and broadband LED applications.
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References
B.E. Sernelius, K.-F. Berggren, Z.-C. Zin, I. Hamberg, C.G. Granqvist, Phys. Rev. B 37, 10244 (1988)
B.J. Jin, S. Im, S.Y. Lee, Thin Solid Films 366, 107 (2000)
K. Ellmer, J. Phys. D, Appl. Phys. 34, 3097–3108 (2001)
Y. Ma, G.T. Du, T.P. Yang, D.L. Qiu, X. Zhang, H.J. Yang, Y.T. Zhang, B.J. Zhao, X.T. Yang, D.L. Liu, J. Cryst. Growth 255, 303 (2003)
E. Guziewicz, M. Godlewski, T. Krajewski, Ł. Wachnicki, A. Szczepanik, K. Kopalko, A. Wójcik-Głodowska, E. Przeździecka, W. Paszkowicz, E. Łusakowska, P. Kruszewski, N. Huby, G. Tallarida, S. Ferrari, J. Appl. Phys. 105, 122413 (2009)
S.B. Zhang, S.-H. Wei, A. Zunger, Phys. Rev. B 63, 075205 (2001)
D.C. Look, J.W. Hemsky, J.R. Sizelove, Phys. Rev. Lett. 82, 2552–2555 (1999)
F. Oba, S.R. Nishitani, S. Isotani, H. Adachi, I. Tanaka, J. Appl. Phys. 90, 824–828 (2001)
B.J. Jin, S.H. Bae, S.Y. Lee, S. Im, Mater. Sci. Eng. B 71, 301–305 (2000)
J. Liu, S. Lee, Y.H. Ahn, J.-Y. Park, K.H. Koh, J. Phys. D, Appl. Phys. 42, 095401 (2009)
S.T. Tan, X.W. Sun, J.L. Zhao, S. Iwan, Z.H. Cen, T.P. Chen, J.D. Ye, G.Q. Lo, D.L. Kwong, K.L. Teo, Appl. Phys. Lett. 93, 013506 (2008)
L.M. Kukreja, P. Misra, J. Fallert, D.M. Phase, H. Kalt, J. Appl. Phys. 112, 013525 (2012)
S. Choopun, R.D. Vispute, W. Noch, A. Balsamo, R.P. Sharma, T. Venkatesan, A. Iliadis, D.C. Look, Appl. Phys. Lett. 75, 3947 (1999)
L.M. Kukreja, A.K. Das, P. Misra, Bull. Mater. Sci. 32, 247 (2009)
P. Misra, A.K. Das, L.M. Kukreja, Phys. Status Solidi C 7, 1718 (2010)
R.S. Ajimsha, K.A. Vanaja, M.K. Jayaraj, P. Misra, V.K. Dixit, L.M. Kukreja, Thin Solid Films 515, 7352 (2007)
A. Furukawa, N. Ogasawara, R. Yokozawa, T. Tokunaga, Jpn. J. Appl. Phys. 47, 8799 (2008)
Y.-S. Kim, C.H. Park, Phys. Rev. Lett. 102, 086403 (2009)
A. Janotti, C.G. Van de Walle, Phys. Rev. B 76, 165202 (2007)
M. Wilkens, Phys. Status Solidi A 2, 359–370 (1970)
G.K. Williamson, W.H. Hall, Acta Metall. Mater. 1, 22 (1953)
Y. Chen, D.M. Bagnall, H.-J. Koh, K.-T. Park, K. Hiraga, Z. Zhu, T. Yao, J. Appl. Phys. 84, 3912 (1998)
X.Q. Menga, D.Z. Shen, J.Y. Zhang, D.X. Zhao, Y.M. Lu, L. Dong, Z.Z. Zhang, Y.C. Liu, X.W. Fan, Solid State Commun. 135, 179 (2005)
S.Y. Hu, Y.C. Lee, J.W. Lee, J.C. Huang, J.L. Shen, W. Water, Appl. Surf. Sci. 254, 1578 (2008)
S.A. Studenikin, N. Golego, M. Cocivera, J. Appl. Phys. 84, 2287 (2005)
L. Wang, L.C. Giles, J. Appl. Phys. 94, 973 (2003)
W. Shan, W. Walukiewicz, J.W. Ager, K.M. Yu, H.B. Yuan, H.P. Xin, G. Cantwell, J.J. Song, Appl. Phys. Lett. 86, 191911 (2005)
E. Gross, S. Permogorov, B. Razbirin, J. Phys. Chem. Solids 27, 1647 (1966)
T. Monteiro, C. Boemare, M.J. Soares, E. Rita, E. Alves, J. Appl. Phys. 93, 8995 (2003)
D.W. Hamby, D.A. Lucca, J.-K. Lee, M. Nastasi, Nucl. Instrum. Methods Phys. Res. B 242, 663–666 (2006)
K. Vanheusden, W.L. Warren, C.H. Seager, D.R. Trallant, J.A. Voigt, J. Appl. Phys. 79, 7983 (1996)
K.C. Mishra, P.C. Schmidt, K.H. Johnson, B.G. DeBoer, J.K. Berkowitz, E.A. Dale, Phys. Rev. B 42, 1423 (1990)
D.C. Reynolds, D.C. Look, B. Jogai, H. Morkoç, Solid State Commun. 101, 643 (1997)
D.C. Reynolds, D.C. Look, B. Jogai, J.E. Van Nostrand, R. Jones, J. Jenny, Solid State Commun. 106, 701 (1998)
A.F. Kohan, G. Ceder, D. Morgan, C.G. Van de Walle, Phys. Rev. B 61, 15019 (2000)
T. Sekiguchi, N. Ohashi, Y. Terada, Jpn. J. Appl. Phys. 36, L289 (1997)
Y.P. Varshni, Physica 34, 149 (1967)
D.C. Look, D.C. Reynolds, C.W. Litton, R.L. Jones, D.B. Eason, G. Cantwell, Appl. Phys. Lett. 81, 1830 (2002)
X. Han, Y. Gao, J. Dai, C. Yu, Z. Wu, C. Chen, G. Fang, J. Phys. D, Appl. Phys. 43, 145102 (2010)
M. Chen, X. Wang, Y.H. Yu, Z.L. Pei, X.D. Bai, C. Sun, R.F. Huang, L.S. Wen, Appl. Surf. Sci. 158, 34 (2000)
H.-B. Fan, S.-Y. Yang, P.-F. Zhang, H.-Y. Wei, X.-L. Liu, C.-M. Jiao, Q.-S. Zhu, Y.-H. Chen, Z.-G. Wang, Chin. Phys. Lett. 24, 2108 (2007)
Acknowledgements
Authors thank Dr. B.N. Singh for his help in experiments. Some part of the present work was carried out at UGC-DAE CSR, Indore. We also thank Mr. Avanish Wadikar of UGC-DAE CSR, Indore, for his help in XPS measurements. We thank Miss. Sushmita Bhartiya for her help in AFM image processings.
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Das, A.K., Misra, P., Kumar, R. et al. Studies on highly resistive ZnO thin films grown by DC-discharge-assisted pulsed laser deposition. Appl. Phys. A 114, 1119–1128 (2014). https://doi.org/10.1007/s00339-013-7653-z
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DOI: https://doi.org/10.1007/s00339-013-7653-z