Abstract
In this paper,we fabricate a lateral phase change memory device composed of a Ge2Sb2Te5 nanowire (GST NW) fully confined in a tungsten electrode nanogap. A SiNx spacer is used not only as etch mask for the fabrication of the GST NW, but also as sacrificial layer for the lift-off process, which makes it feasible to fully confine the GST NW in the metal electrode nanogap. Electrical characterization shows that the device has unprecedentedly low threshold current and SET voltage of only 16 μA and 80 mV, respectively.
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Acknowledgements
This work was supported in part by the National High-tech Research and Development Program (863) under the grant number 2008AA031402, and the National Natural Science Foundation of China under the grant numbers 61076077 and 61106120.
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Fu, Y., Wang, X., Zhang, J. et al. A lithography-independent and fully confined fabrication process of phase-change materials in metal electrode nanogap with 16-μA threshold current and 80-mV SET voltage. Appl. Phys. A 110, 173–177 (2013). https://doi.org/10.1007/s00339-012-7083-3
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DOI: https://doi.org/10.1007/s00339-012-7083-3