Abstract
We studied the effect of irradiation on small angle grain boundaries in mosaic structured Cu thin films. The films showed a decrease in mosaic spread via a narrowing of the full width at half maximum in XRD rocking curves and a smaller minimum yield of RBS channeling after irradiation. These data indicate the irradiation decreased the misorientation angles between mosaic blocks separated by small angle grain boundaries. Mechanisms involving interactions between grain boundary dislocations and irradiation induced defects are discussed.
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Acknowledgements
This work was supported by the Center for Materials at Irradiation and Mechanical Extremes (CMIME), an Energy Frontier Research Center (EFRC) funded by the US Department of Energy, Office of Science, Office of Basic Energy Sciences under Award Number 2008LANL1026. The X-ray analysis portion of this work was supported by the Center for Integrated Nanotechnologies (CINT), the US Department of Energy, Office of Basic Energy Sciences user facility at Los Alamos National Laboratory (LANL).
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Fu, E.G., Wang, Y.Q., Zou, G.F. et al. Irradiation induced changes in small angle grain boundaries in mosaic Cu thin films. Appl. Phys. A 108, 121–126 (2012). https://doi.org/10.1007/s00339-012-6865-y
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DOI: https://doi.org/10.1007/s00339-012-6865-y