Abstract
The linear energy–momentum relation results in more high-energy electrons in 2D (two-dimensional) graphene FETs (field-effect transistor) than those in silicon FETs that features parabolic energy–momentum relation if the same surface electron density has been assumed in all FETs. The numerical calculations demonstrate that, under such assumption, the gate leakage currents in graphene FETs are much larger than that in silicon FETs. The results illustrate that if the conduction band offset between graphene and gate oxide is lower than 3.55 eV, the gate leakage currents in graphene electronics are more significant than those in the silicon electronics.
Similar content being viewed by others
References
C. Berger, Z. Song, X. Li, X. Wu, N. Brown, C. Naud, D. Mayou, T. Li, J. Hass, A.N. Marchenkov, E.H. Conrad, P.N. First, W.A. de Heer, Science 312, 1191 (2006)
K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, Y. Zhang, S.V. Dubonos, I.V. Crigorieva, A.A. Firsov, Science 306, 666 (2004)
K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, M.I. Katsnelson, I.V. Grigorieva, S.V. Dubonos, A.A. Firsov, Nature 438, 197 (2005)
M.C. Lemme, T.J. Echtermeyer, M. Baus, H. Kurz, IEEE Electron Device Lett. 28, 282 (2007)
Y.B. Zhang, Y.W. Tan, H.L. Stormer, P. Kim, Nature 438, 201 (2005)
L.F. Mao, X.J. Li, Z. O Wang, J.Y. Wang, IEEE Electron Device Lett. 29, 1047 (2008)
A. Das, S. Pisana, B. Chakraborty, S. Piscanec, S.K. Saha, U.V. Waghmare, K.S. Novoselov, H.R. Krishnamurthy, A.K. Geim, A.C. Ferrari, A.K. Sood, Nat. Nanotechnol. 3, 210 (2008)
Q. Zhang, T. Fang, H. Xing, A. Seabaugh, D. Jeana, IEEE Electron Device Lett. 29, 1344 (2008)
V. Ryzhii, M. Ryzhii, A. Satou, T. Ostuji, J. Appl. Phys. 103, 094510 (2008)
G. Gu, S. Nie, R.M. Feenstra, R.P. Devaty, W.J. Choyke, W.K. Chan, M.G. Kane, Appl. Phys. Lett. 90, 253507 (2007)
Y.Q. Wu, P.D. Ye, M.A. Capano, Y. Xuan, Y. Sui, M. Qi, J.A. Cooper, T. Shen, D. Pandey, G. Prakash, R. Reifenberger, Appl. Phys. Lett. 92, 092102 (2008)
W.K. Chim, P.S. Lim, J. Appl. Phys. 91, 1577 (2002)
F. Buonocore, F. Trani, D. Ninno, A. Di Matteo, G. Cantele, G. Iadonis, Nanotechnology 19, 02571 (2005)
D. Bohm, Quantum Theory (Prentice Hall, Englewood Cliffs, 1951)
Z.A. Weinberg, J. Appl. Phys. 53, 5052 (1982)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Mao, LF. Energy distribution of channel electrons and its impacts on the gate leakage current in graphene field-effect transistors. Appl. Phys. A 98, 565–569 (2010). https://doi.org/10.1007/s00339-009-5509-3
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00339-009-5509-3