Abstract
The silica supported titania nanocomposite thin films with controllable particle size and phase content were successfully prepared by a convenient post annealing approach involving in solid-solid interfacial reaction. The effects of growth conditions, such as the annealing temperature and silicon concentration on the particle size and phase content, were systematically studied by using Atomic force microscopy (AFM), Raman spectroscopy, X-ray diffraction (XRD), and X-ray spectroscopy (XPS). The results indicate that the silicon concentration is a dominant factor in the morphology, crystallization and phase transformation of these nanocomposites. A mechanism for the high temperature phase transformation is also proposed based on the migration of the oxygen vacancies.
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References
R. O’ Regan, M. Grätzel, Nature 353, 737 (1991)
M.E. Zorn, T.D. Tompkins, W.A. Zeltner, M.A. Anderson, Appl. Catal. B 23, 1 (1999)
Y.S. Ahn, S.H. Ban, K.J. Kim, H. Kang, S. Yang, Y. Roh, N.E. Lee, Jpn. J. Appl. Phys. 41, 7282 (2002)
E. Garfunkel, E. Gusev, A. Vul’, Fundamental Aspects of Ultrathin Dielectrics of Si-based Devices. NATO Science Series (Kluwer Academic, Dordrecht, 1998)
T. Umebayashi, T. Yamaki, H. Itoh, K. Asai, Appl. Phys. Lett. 81, 454 (2002)
D. Bersani, P.P. Lottici, X.Z. Ding, Appl. Phys. Lett. 72, 73 (1998)
A. Fujishima, K. Honda, Nature 238, 37 (1972)
R. Asahi, T. Morikawa, T. Ohwaki, K. Aoki, Y. Taga, Science 293, 269 (2000)
I. Justicia, P. Ordejon, Adv. Mater. 19, 1399 (2002)
S. Sato, Langmuir 4, 1156 (1988)
A. Heller, Y. Degani, D.W. Johnson, J. Phys. Chem. 91, 5987 (1987)
O. Carp, C.L. Huisman, A. Reller, Prog. Solid State Chem. 32, 33 (2004)
F. Gracia, F. Yubero, J.P. Holgado, J.P. Espinos, A.R. Gonzalez-Elipe, T. Girardeau, Thin Solid Films 500, 19 (2006)
H. Zhang, J.F. Banfield, Am. Mineral. 84, 528 (1999)
R. Arroyo, G. Córdoba, J. Padilla, V.H. Lara, Mater. Lett. 54, 397 (2002)
K. Wang, K. Hashimoto, A. Fujishima, Nature 388, 431 (1997)
M. Machida, K. Norimoto, T. Watanabe, J. Mater. Sci. 34, 2569 (1999)
W. Que, Y. Zhou, L. Lam, Z. Sun, S.D. Cheng, H.P. Li, C.H. Kam, J. Mater. Sci. Lett. 19, 1247 (2000)
K. Okada, N. Yamamoto, N. Kameshima, A. Yasumori, J. Am. Ceram. Soc. 84, 1591 (2001)
R. Rodriguez, S. Vargas, R. Arroyo-Murillo, R. Montiel-Campos, E. Haro, J. Mater. Res. 12, 439 (1997)
S. Karvinen, Solid State Sci. 5, 811 (2003)
G.R. Gu, Z. He, Y. Tao, Y. Li, H. Yin, W. Li, Y. Zhao, Vacuum 70, 17 (2003)
V. Puntes, K.M. Krishnan, A.P. Alivisatos, Science 291, 2115 (2001)
G.A. Tompsett, G.A. Bowmaker, R.P. Cooney, J.B. Metson, K.A. Rodgers, J.M. Seakins, J. Raman Spectrosc. 26, 57 (1995)
R. Grieken, J. Aguado, M.J. López-Muñoz, J. Marugán, J. Photochem. Photobiol. A 148, 315 (2002)
X. Fu, L.A. Clark, Q. Yang, M.A. Anderson, Environ. Sci. Technol. 30, 697 (1996)
D.J. Kim, J.W. Jang, H.L. Lee, J. Am. Ceram. Soc. 80, 1453 (1997)
C.Y. Xu, P.X. Zhang, L. Yan, J. Raman. Spectrosc. 32, 862 (2001)
K. Koga, H. Takeo, Rev. Sci. Instrum. 67, 4092 (1996)
B.C. Gou, Z.X. Liu, Q.L. Cui, H.B. Yang, Y.N. Zhao, G.T. Zou, High Press. Res. 1, 185 (1989)
C.C. Wang, J.Y. Ying, Chem. Mater. 11, 3113 (1999)
P. Knauth, G. Auer, Solid State Ion. 147, 112 (2002)
The NIST X-ray Photoelectron Spectroscopy Database (online). Copyright by the U.S. Secretary of Commerce on behalf of the United States of America (2008)
B.V. Crist, The Elements and Native Oxides. Handbook of Monochromatic XPS Spectra, vol. 1 (Wiley, New York, 2000)
G. Lu, S.L. Bernasek, J. Schwartz, Surf. Sci. 458, 80 (2000)
W. Zhang, Y. Li, S. Zhu, F. Wang, Surf. Coat. Technol. 182, 192 (2004)
R. Gouttebaron, D. Cornelissen, R. Snyders, J.P. Dachot, M. Wautelet, M. Hecq, Surf. Interface Anal. 30, 527 (2000)
R. Schaub, E. Wahlström, A. Rønnau, E. Lægsgaard, I. Stensgaard, F. Besenbacher, Science 299, 377 (2003)
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Lim, Y.V., Fan, H., Shen, Z. et al. Synthesis of silica supported titania nanocomposite in controllable phase content and morphology. Appl. Phys. A 95, 555–562 (2009). https://doi.org/10.1007/s00339-008-4942-z
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DOI: https://doi.org/10.1007/s00339-008-4942-z