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The abnormal direct-current resistivity of Ni–Mn–Ni triple-layered magnetic thin-films and their magnetic wall observations

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Abstract

We have observed an abnormal electron transport characteristic from the Ni–Mn–Ni triple-layered magnetic thin-films. Due to the intercalated Mn ultra-thin interlayer, the magnetic domain structure and the electron transport characteristic differ a lot from their original magnetic (Fe, Co, and Ni) films. As inspected by a magnetic force microscopy (MFM), we observed the variation of the domain configuration with Mn interlayer thicknesses (for 1, 5, and 10 nm). Moreover, we also examined and found that the direct current (DC) resistivity have no significant change as the current conducts from the current-in-wall (CIW) to the current- perpendicular-to-wall (CPW), which are opposite to the results of single layered films.

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Authors and Affiliations

  1. Institute of Photonics Technologies, National Tsing Hua University, Hsin Chu, Taiwan

    Yi-Chen Yeh & Chun-Han Chiu

  2. Department of Physics, National Tsing Hua University, Hsin Chu, Taiwan

    Juh Tzeng Lue

Authors
  1. Yi-Chen Yeh
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  2. Chun-Han Chiu
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  3. Juh Tzeng Lue
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Correspondence to Juh Tzeng Lue.

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Yeh, YC., Chiu, CH. & Lue, J.T. The abnormal direct-current resistivity of Ni–Mn–Ni triple-layered magnetic thin-films and their magnetic wall observations. Appl. Phys. A 94, 923–926 (2009). https://doi.org/10.1007/s00339-008-4862-y

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  • DOI: https://doi.org/10.1007/s00339-008-4862-y

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