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Ion extraction from the surface ablated materials in electric fields using an intense femtosecond laser pulse

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Abstract

In order to develop a femtosecond laser ablation (fsLA) ion source for TOF mass spectrometry, we have analyzed time-resolved images of laser-induced fluorescence from Sm+ ions produced by fsLA of a solid samarium in electric fields. The polarity and the strength of electric fields had a remarkable effect on the expansion of Sm+ ions. Moreover, accelerating electric fields elongated the duration of the ion emission from the samarium surface in fsLA, which degraded time-focusing of the ions. We have found that suppression the continuous ion emission caused by fsLA in electric fields is most important in TOF measurements.

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Authors and Affiliations

  1. RIKEN Genomic Science Center, Tsurumi, Yokohama, Kanagawa, 230-0045, Japan

    T. Kato, M. Kurata-Nishimura, Y. Okamura-Oho, T. Sano, Y. Hayashizaki & J. Kawai

  2. Discovery Research Institute, RIKEN, Wako, Saitama, 351-0198, Japan

    T. Kobayashi, Y. Hayashizaki & J. Kawai

  3. RIKEN Nishina Center for Accelerator-Based Science, Wako, Saitama, 351-0198, Japan

    Y. Matsuo

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  1. T. Kato
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  2. M. Kurata-Nishimura
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  3. T. Kobayashi
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  4. Y. Okamura-Oho
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  5. T. Sano
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  6. Y. Hayashizaki
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  7. Y. Matsuo
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  8. J. Kawai
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Correspondence to T. Kato.

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Kato, T., Kurata-Nishimura, M., Kobayashi, T. et al. Ion extraction from the surface ablated materials in electric fields using an intense femtosecond laser pulse. Appl. Phys. A 92, 809–812 (2008). https://doi.org/10.1007/s00339-008-4583-2

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  • DOI: https://doi.org/10.1007/s00339-008-4583-2

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