Applied Physics A

, Volume 91, Issue 4, pp 693–699 | Cite as

Structural, ferroelectric and optical properties of Bi2VO5.5 thin films deposited on platinized silicon {(100) Pt/TiO2/SiO2/Si} substrates

Article

Abstract

Bismuth vanadate (Bi2VO5.5, BVO) thin films have been deposited by a pulsed laser ablation technique on platinized silicon substrates. The surface morphology of the BVO thin films has been studied by atomic force microscopy (AFM). The optical properties of the BVO thin films were investigated using spectroscopic ellipsometric measurements in the 300–820 nm wavelength range. The refractive index (n), extinction coefficient (k) and thickness of the BVO thin films have been obtained by fitting the ellipsometric experimental data in a four-phase model (air/BVOrough/BVO/Pt). The values of the optical constants n and k that were determined through multilayer analysis at 600 nm were 2.31 and 0.056, respectively. For fitting the ellipsometric data and to interpret the optical constants, the unknown dielectric function of the BVO films was constructed using a Lorentz model. The roughness of the films was modeled in the Brugmann effective medium approximation and the results were compared with the AFM observations.

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References

  1. 1.
    J.F. Scott, C.A. Paz de Araujo, Science 246, 1400 (1989)CrossRefADSGoogle Scholar
  2. 2.
    C.A. Paz de Araujo, J.D. Cuchiaro, L.D. McMillan, M.C. Scott, J.F. Scott, Nature (London) 374, 627 (1995)CrossRefADSGoogle Scholar
  3. 3.
    O. Auciello, J.F. Scott, R. Ramesh, Phys. Today 51, 22 (1998)CrossRefGoogle Scholar
  4. 4.
    P. Yang, N. Zhou, L. Zheng, H. Lu, C. Lin, J. Phys. D 30, 527 (1997)CrossRefADSGoogle Scholar
  5. 5.
    Y.H. Xu, J.D. Mackenzie, Integr. Ferroelectr. 1, 17 (1992)CrossRefGoogle Scholar
  6. 6.
    G.H. Haertling, Ferroelectrics 75, 25 (1987)CrossRefGoogle Scholar
  7. 7.
    M.P. Moret, M.A.C. Devillers, K. Wörthoff, P.K. Larsen, J. Appl. Phys. 92, 468 (2002)CrossRefADSGoogle Scholar
  8. 8.
    R. Watton, P. Manning, Proc. SPIE 3436, 541 (1998)CrossRefADSGoogle Scholar
  9. 9.
    C.M. Hanson, H.R. Beratan, J.F. Belcher, K.R. Udayakumar, K.L. Soch, Proc. SPIE 3379, 60 (1998)CrossRefADSGoogle Scholar
  10. 10.
    H. Xu, K. Hashimoto, T. Mukaigawa, H. Zhu, R. Kubo, T. Usuki, H. Kishihara, M. Noda, Y. Suzaki, M. Okuyama, Proc. SPIE 4130, 140 (2000)CrossRefADSGoogle Scholar
  11. 11.
    B.H. Park, B.S. Kang, S.D. Bu, T.W. Noh, J. Lee, M. Jo, Nature (London) 401, 682 (1999)CrossRefADSGoogle Scholar
  12. 12.
    H.N. Lee, D. Hesse, N. Zakharov, U. Gosele, Science 296, 2006 (2002)CrossRefADSGoogle Scholar
  13. 13.
    J.H. Bahng, M. Lee, H.L. Park, W. Kim, J.H. Jeong, K. Kim, J. Appl. Phys. Lett. 79, 1664 (2001)CrossRefADSGoogle Scholar
  14. 14.
    A. Kingon, Nature (London) 401, 658 (1999)CrossRefADSGoogle Scholar
  15. 15.
    B. Aurivillius, Nature (London) 2, 519 (1950)Google Scholar
  16. 16.
    A.A. Bush, Y.N. Venevtsev, Russ. J. Inorg. Chem. 31, 769 (1986)Google Scholar
  17. 17.
    V.G. Osipyan, L.M. Savchenko, V.L. Elbakyan, P.B. Avakyan, Inorg. Mater. 23, 467 (1987)Google Scholar
  18. 18.
    V.N. Borisov, Y.M. Poplavko, P.B. Avakyan, V.G. Osipyan, Sov. Phys. Solid State 30, 904 (1988)Google Scholar
  19. 19.
    K.B.R. Varma, G.N. Subbanna, T.N. Guru Row, C.N.R. Rao, J. Mater. Res. 5, 2718 (1990)CrossRefADSGoogle Scholar
  20. 20.
    K.V.R. Prasad, K.B.R. Varma, A.R. Raju, K.M. Satyalakshmi, R.M. Mallya, M.S. Hegde, Appl. Phys. Lett. 63, 1898 (1993)CrossRefADSGoogle Scholar
  21. 21.
    Z. Huang, P. Yang, Y. Chang, J. Chu, J. Appl. Phys. 86, 1771 (1999)CrossRefADSGoogle Scholar
  22. 22.
    Z. Huang, X. Meng, P. Yang, Z. Zhang, J. Chu, Appl. Phys. Lett. 76, 3980 (2000)CrossRefADSGoogle Scholar
  23. 23.
    P. Yang, J. Xu, J. Ballato, R. Schwartz, D. Carroll, Appl. Phys. Lett. 80, 3394 (2002)CrossRefADSGoogle Scholar
  24. 24.
    A. Petraru, J. Schubert, M. Schmid, C. Buchal, Appl. Phys. Lett. 81, 1375 (2002)CrossRefADSGoogle Scholar
  25. 25.
    M. Viswanathan, G.K.M. Thutupalli, K.B.R. Varma, Solid State Commun. 98, 535 (1996)CrossRefADSGoogle Scholar
  26. 26.
    F.K. Lotgering, J. Inorg. Nucl. Chem. 9, 113 (1959)CrossRefGoogle Scholar
  27. 27.
    N. Kumari, S.B. Krupanidhi, K.B.R. Varma, Mater. Sci. Eng. B 138, 22 (2007)CrossRefGoogle Scholar
  28. 28.
    R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977)Google Scholar
  29. 29.
    Z.G. Hu, Z.M. Huang, Y.N. Wu, G.S. Wang, X.J. Meng, F.W. Shi, J.H. Chu, J. Vac. Sci. Technol. A 22, 1152 (2004)CrossRefADSGoogle Scholar
  30. 30.
    D.E. Aspnes, J.B. Theeten, F. Hottier, Phys. Rev. B 20, 3292 (1979)CrossRefADSGoogle Scholar
  31. 31.
    J.H. Weaver, Phys. Rev. B 11, 1416 (1975)CrossRefADSGoogle Scholar

Copyright information

© Springer-Verlag 2008

Authors and Affiliations

  1. 1.Materials Research CenterIndian Institute of ScienceBangaloreIndia

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