Skip to main content
Log in

Effect of heat treatment on the structure and properties of chemical solution processed multiferroic BiFeO3 thin films

  • Published:
Applied Physics A Aims and scope Submit manuscript

Abstract

In this work, we report on the growth and characterization of polycrystalline BiFeO3 (BFO) thin films deposited on indium tin oxide (ITO) coated glass substrates via the chemical solution deposition technique. The as-deposited films were crystallized by heat treatment at various temperatures for 1 h in various atmospheres, i.e. oxygen, air and nitrogen. Grazing angle X-ray diffraction (GIXRD) analysis of the heat treated films revealed that both annealing temperatures as well as the atmosphere, had a pronounced effect on the formation of pure perovskite-type BiFeO3 phase. Ferroelectric measurements showed that the films heat treated in nitrogen showed superior characteristics to those heat treated in air and oxygen with a remanent polarization of 0.52 μC/cm2 and 1.9 μC/cm2 for the films annealed at 600 °C and 650 °C respectively at an applied field of 60 kV/cm. BiFeO3 films annealed in nitrogen also showed maximum dielectric constant (εr∼300), superior leakage resistance and magnetic properties over other films.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. J. Wang, J.B. Neaton, H. Zheng, V. Nagarajan, S.B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D.G. Schlom, U.V. Waghmare, N.A. Spaldin, K.M. Rabe, M. Wutting, Science 299, 1791 (2003)

    Google Scholar 

  2. M. Fiebig, T. Lottermoser, D. Frohlich, A.V. Goltsev, R.V. Pisarev, Nature 419, 81 (2002)

    Article  Google Scholar 

  3. M.M. Kumar, V.R. Palkar, K. Shrinivas, S.V. Suryanarayan, Appl. Phys. Lett. 76, 764 (2000)

    Article  Google Scholar 

  4. A. Srinivas, D.W. Kim, K.S. Hong, S.V. Suryanaraynan, Appl. Phys. Lett. 83, 2217 (2003)

    Article  ADS  Google Scholar 

  5. H. Liu, Z. Liu, Q. Liu, K. Yao, Thin Solid Films 500, 105 (2006)

    Article  ADS  Google Scholar 

  6. S.S. Fedulov, Sov. Phys. Dokl. 6, 729 (1962) (English Transl.)

    ADS  Google Scholar 

  7. C. Michel, J.M. Moreau, G.D. Achenbach, R. Gerson, W.J. James, Solid State Commun. 7, 701 (1969)

    Article  ADS  Google Scholar 

  8. F. Kubel, H. Schmid, Acta Cryst. B 46, 698 (1990)

    Article  Google Scholar 

  9. J.D. Bucci, B.K. Robertson, W.J. James, J. Appl. Cryst. 5, 187 (1972)

    Article  Google Scholar 

  10. J.R. Teague, R. Gerson, W.J. James, Solid State Commun. 8, 10739 (1970)

    Article  Google Scholar 

  11. K.Y. Kun, M. Noda, M. Okuyama, Appl. Phys. Lett. 83, 398 (2003)

    Article  Google Scholar 

  12. V.R. Palkar, J. John, R. Pinto, Appl. Phys. Lett. 80, 1628 (2002)

    Article  ADS  Google Scholar 

  13. G. Teowee, K. McCarthy, T.J. Bukowski, T.P. Alexander, Integr. Ferroelectr. 18, 329 (1997)

    Article  Google Scholar 

  14. C.T. Munoz, J.P. Rivera, A. Monnier, H. Schmid, Japan. J. Appl. Phys. 24, 1051 (1985)

    Google Scholar 

  15. X. Hu, A. Garg, Z.H. Barber, Thin Solid Films 484, 188 (2005)

    Article  ADS  Google Scholar 

  16. A.J. Moslson, J.M. Herbert, Electroceramics (John Wiley & Sons Ltd., Chichester, UK, 1990) pp. 68–258

  17. C.F. Yang, Japan. J. Appl. Phys. 36, 188 (1997)

    Article  ADS  Google Scholar 

  18. K.Y. Yun, M. Noda, M. Okuyama, J. Korean Phys. Soc. 42, 1153 (2003)

    Google Scholar 

  19. K.Y. Yun, M. Noda, M. Okuyama, H. Saeki, H. Tabata, K. Saito, J. Appl. Phys. 96, 3399 (2004)

    Article  ADS  Google Scholar 

  20. C. Ederer, A. Spaldin, Phys. Rev. B 71, 224103 (2005)

    Article  ADS  Google Scholar 

  21. W. Eerenstein, F.D. Morrison, J. Dho, M.G. Blamire, J.F. Scott, N.D. Mathur, Science 307, 1203 (2005)

    Article  Google Scholar 

  22. J. Wang, A. Scholl, H. Zheng, S.B. Ogale, D. Viehland, D.G. Schlom, N.A. Spaldin, K.M. Rabe, M. Wuttig, L. Mohaddes, J. Neaton, U. Waghmare, T. Zhao, R. Ramesh, Science 307, 1204 (2005)

    Article  Google Scholar 

  23. D. Lee, M.G. Kim, S. Ryu, H.M. Jang, S.G. Lee, Appl. Phys. Lett. 86, 222903 (2005)

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to A. Garg.

Additional information

PACS

77.80.-e; 77.84.-S; 75.50.Bb

Rights and permissions

Reprints and permissions

About this article

Cite this article

Singh, V., Dixit, A., Garg, A. et al. Effect of heat treatment on the structure and properties of chemical solution processed multiferroic BiFeO3 thin films. Appl. Phys. A 90, 197–202 (2008). https://doi.org/10.1007/s00339-007-4257-5

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s00339-007-4257-5

Keywords

Navigation