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Real time in situ hard X-ray texture evolution during the annealing of rolled CuNi tapes

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Abstract

A new real time in-situ scattering method to study texture evolution kinetics is detailed. The technique is adapted from an existing set up used at the Institut Laue–Langevin neutron facility to check monochromators. It uses a white hard X-ray beam and works in transmission geometry. A 2D detector allows following of the recrystallization phenomena. A study of the annealing behavior of copper-nickel alloy rolled tapes, used as a substrate for high temperature superconductors, is presented.

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Authors and Affiliations

  1. Systèmes et Matériaux pour la Mécatronique, Université de Savoie, BP 80439, 74944, Annecy le Vieux, France

    A. Girard

  2. Consortium de Recherches pour l’Émergence de Technologies Avancées, CNRS, BP 166, 38042, Grenoble Cedex 9, France

    A. Girard & J.-L. Soubeyroux

  3. Institut Néel, CNRS, BP 166, 38042, Grenoble Cedex 9, France

    A. Girard & J.-L. Soubeyroux

  4. Laboratoire de Spectrométrie Physique, UJF-CNRS, BP 87, 38402, St. Martin d’Hères, France

    P. Bastie

  5. Institut Laue–Langevin, BP 156, 38042, Grenoble Cedex 9, France

    P. Bastie & J.-L. Soubeyroux

Authors
  1. A. Girard
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  2. P. Bastie
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  3. J.-L. Soubeyroux
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Corresponding author

Correspondence to P. Bastie.

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PACS

61.66.Dk; 61.10.Eq; 61.18.-j; 81.05.Bx; 81.40.Ef

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Girard, A., Bastie, P. & Soubeyroux, JL. Real time in situ hard X-ray texture evolution during the annealing of rolled CuNi tapes. Appl. Phys. A 90, 179–184 (2008). https://doi.org/10.1007/s00339-007-4254-8

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  • DOI: https://doi.org/10.1007/s00339-007-4254-8

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