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Studies of electrochemically grafted thin organic layers on inorganic surfaces with infrared spectroscopic ellipsometry

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Abstract

We present IR spectroscopic ellipsometry (IRSE) measurements of electrochemically grafted organic ultrathin films down to monolayer thickness. The formation of organic layers of 4-methoxybenzene (anisole) on TiO2, Au, and Si(111) surfaces was confirmed from observation of the respective absorption bands in the ellipsometric spectra. We discuss the orientation of molecules in a thin film on an Au substrate and in a thick film grafted on a TiO2 substrate. The appearance of silicon oxide related bands in the IRSE spectra shows that oxidation is a side reaction of the electrochemical grafting on Si substrates. These results demonstrate the potential of IRSE application in studies of interfacial structures and thin film engineering.

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Authors and Affiliations

  1. ISAS—Institute for Analytical Sciences, Department Berlin , Albert-Einstein-Str. 9, 12489, Berlin, Germany

    K. Roodenko, M. Gensch, N. Esser & K. Hinrichs

  2. Abteilung Silizium-Photovoltaik, Hahn-Meitner-Institut Berlin GmbH, Kekuléstr. 5, 12489, Berlin, Germany

    J. Rappich

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  1. K. Roodenko
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  2. J. Rappich
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  3. M. Gensch
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  4. N. Esser
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  5. K. Hinrichs
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Correspondence to K. Hinrichs.

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PACS

68.35.Ja; 82.45.Wx; 82.45.Jn

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Roodenko, K., Rappich, J., Gensch, M. et al. Studies of electrochemically grafted thin organic layers on inorganic surfaces with infrared spectroscopic ellipsometry. Appl. Phys. A 90, 175–178 (2008). https://doi.org/10.1007/s00339-007-4251-y

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  • DOI: https://doi.org/10.1007/s00339-007-4251-y

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