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Nonlinear optical characterization of LaEr(MoO4)3 thin films using the Z -scan technique

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Abstract

The nonlinear optical properties of thin films of LaEr(MoO4)3 were studied using a ∼30 ps Nd:YAG laser at 532 nm with a repetition rate of 250 Hz. Closed aperture Z-scan measurement revealed a negative nonlinearity in the LaEr(MoO4)3. The nonlinear refractive index γ=1.38×10-10 cm2/W and nonlinear absorption coefficient β=16.8×10-6 cm/W were calculated from the Z-scan data. The fluorescent upconversion spectra were recorded with 980 nm excitation. An optical switching mechanism based on nonlinear absorption is also presented experimentally.

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Authors and Affiliations

  1. Department of Physics, Rutgers – The State University of New Jersey, Camden, NJ, 08102, USA

    U. Gurudas & D.M. Bubb

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  1. U. Gurudas
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  2. D.M. Bubb
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Correspondence to U. Gurudas or D.M. Bubb.

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PACS

81.15.Fg; 77.84.Bw; 33.50.Dq; 42.70.Mp

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Gurudas, U., Bubb, D. Nonlinear optical characterization of LaEr(MoO4)3 thin films using the Z -scan technique. Appl. Phys. A 88, 255–259 (2007). https://doi.org/10.1007/s00339-007-4019-4

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  • DOI: https://doi.org/10.1007/s00339-007-4019-4

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