Abstract
We deposited copper phthalocyanine (CuPc) films on (100) silicon wafers by means of a vacuum evaporation method and investigated the absorption characteristics by means of photoacoustic (PA) spectroscopy. It was verified that we excluded the PA signal originated in the silicon substrate with the chopping frequency of 200 Hz when the thickness of the CuPc film was 4.4 μm. We then detected an absorption band at 1.128 eV (1.1 μm). This band is possibly related to the charge transfer between Cu atoms and adsorbed oxygen molecules.
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78.66.Qn; 78.20.Hp
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Ohmukai, M., Kubota, H. & Tsutsumi, Y. The absorption band at 1.128 eV of copper phthalocyanine films. Appl. Phys. A 88, 315–317 (2007). https://doi.org/10.1007/s00339-007-3928-6
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DOI: https://doi.org/10.1007/s00339-007-3928-6