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Temperature dependent structure of spider silk by X-ray diffraction

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Abstract

We have investigated the structure of spider dragline silk by X-ray diffraction over a broad temperature range from room temperature up to thermal denaturation conditions. The dominating signal from the β-sheet crystallites is analyzed. Pronounced changes of scattering intensity starting at temperatures around 150 °C are observed. These changes are discussed in view of the respective lattice constants, crystal size, size distribution, crystallite number density and amino acid composition.

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Authors and Affiliations

  1. Institut für Röntgenphysik, Universität Göttingen, Friedrich-Hund-Platz 1, 37077, Göttingen, Germany

    A. Glišović & T. Salditt

Authors
  1. A. Glišović
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  2. T. Salditt
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Correspondence to T. Salditt.

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PACS

87.68.+z; 87.15.-v; 87.64.Bx

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Glišović, A., Salditt, T. Temperature dependent structure of spider silk by X-ray diffraction. Appl. Phys. A 87, 63–69 (2007). https://doi.org/10.1007/s00339-006-3849-9

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  • DOI: https://doi.org/10.1007/s00339-006-3849-9

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