Abstract
Lead titanate ceramics have been prepared by two different processing methods: conventional (or single-stage) and two-stage sintering. Effects of designed sintering conditions on phase formation, densification, microstructure and dielectric properties of the ceramics were characterized via X-ray diffraction, Archimedes density measurement, scanning electron microscopy and dielectric measurement, respectively. The potentiality of a two-stage sintering technique as a simple ceramic fabrication method to obtain highly dense and pure lead titanate ceramics was demonstrated. It has been found that, under suitable two-stage sintering conditions, dense perovskite lead titanate ceramics can be successfully achieved with better dielectric properties than those of ceramics from a single-stage sintering technique.
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References
B. Jaffe, W.R. Cook, H. Jaffe, Piezoelectric Ceramics (Academic, New York, 1971)
G.H. Haertling, J. Am. Ceram. Soc. 82, 797 (1999)
A.J. Moulson, J.M. Herbert, Electroceramics, 2nd edn. (Wiley, Chichester, 2003)
T. Takahashi, Am. Ceram. Soc. Bull. 69, 691 (1990)
L.E. Cross, Mater. Chem. Phys. 43, 108 (1996)
G. Shirane, S. Hoshino, J. Phys. Soc. Japan 6, 265 (1951)
G. Shirane, R. Pepinsky, B.C. Frazer, Acta Crystallogr. 9, 131 (1956)
H. Takeuchi, S. Jyomura, E. Yamamoto, Y. Ito, J. Acoust. Soc. Am. 72, 1114 (1982)
L.B. Kong, W. Zhu, O.K. Tan, J. Mater. Sci. Lett. 19, 1963 (2000)
T. Suwannasiri, A. Safari, J. Am. Ceram. Soc. 76, 3155 (1993)
T. Takeuchi, M. Tabuchi, I. Kondoh, N. Tamari, H. Kageyama, J. Am. Ceram. Soc. 83, 541 (2000)
J.S. Forrester, J.S. Zobec, D. Phelan, E.H. Kisi, J. Solid State Chem. 177, 3553 (2004)
A. Udomporn, K. Pengpat, S. Ananta, J. Eur. Ceram. Soc. 24, 185 (2004)
S. Ananta, N.W. Thomas, J. Eur. Ceram. Soc. 19, 2917 (1999)
A. Udomporn, S. Ananta, Mater. Lett. 58, 1154 (2004)
H. Klug, L.E. Alexander, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd edn. (Wiley, New York, 1974)
R.L. Fullman, Trans. AIME 197, 447 (1953)
JCPDS-ICDD card no. 6-452, International Centre for Diffraction Data, Newtown Square, PA, 2000
JCPDS-ICDD card no. 77-1971, International Centre for Diffraction Data, Newtown Square, PA, 2000
J. Tartaj, C. Moure, L. Lascano, P. Durán, Mater. Res. Bull. 36, 2301 (2001)
M.L. Calzada, M. Alguero, L. Pardo, J. Sol-Gel Sci. Technol. 13, 837 (1998)
S. Ananta, N.W. Thomas, J. Eur. Ceram. Soc. 19, 629 (1999)
S. Ananta, N.W. Thomas, J. Eur. Ceram. Soc. 19, 1873 (1999)
H.C. Wang, W.A. Schulze, J. Am. Ceram. Soc. 73, 825 (1990)
S.M. Gupta, A.R. Kulkarni, J. Mater. Res. 10, 953 (1995)
T. Takeuchi, M. Takahashi, K. Ado, N. Tamari, K. Ichikawa, S. Miyamoto, M. Kawahara, M. Tabuchi, H. Kageyama, J. Am. Ceram. Soc. 84, 2521 (2001)
Y. Matsuo, H. Sasaki, J. Am. Ceram. Soc. 49, 229 (1966)
S.R. Dhage, Y.B. Khollam, H.S. Potdar, S.B. Deshpande, B.D. Sarwade, D.K. Date, Mater. Lett. 56, 564 (2002)
S. Chattopadhyay, P. Ayyub, V.R. Palkar, M. Multani, Phys. Rev. B 52, 13177 (1995)
M. Villegas, A.C. Caballero, M. Kosec, C. Moure, P. Duran, J.F. Fernandez, J. Mater. Res. 14, 891 (1999)
A. Yamaji, Y. Enomoto, K. Kinoshita, T. Murakami, J. Am. Ceram. Soc. 60, 97 (1977)
B.M. Jin, J. Kim, S.C. Kim, Appl. Phys. A 65, 53 (1997)
W. Cao, C.A. Randall, J. Phys. Chem. Solids 57, 1499 (1996)
S.L. Swartz, T.R. Shrout, W.A. Schulze, L.E. Cross, J. Am. Ceram. Soc. 67, 311 (1984)
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77.22.-d; 77.84.-s; 77.84.Dy
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Wongmaneerung, R., Yimnirun, R. & Ananta, S. Effects of sintering condition on phase formation, microstructure and dielectric properties of lead titanate ceramics. Appl. Phys. A 86, 249–255 (2007). https://doi.org/10.1007/s00339-006-3753-3
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DOI: https://doi.org/10.1007/s00339-006-3753-3