Abstract
In-plane c-axis oriented CaBi4Ti4O15 (CBTi144) films were fabricated on Pt foils using a complex metal alkoxide solution. The a/b-axis orientation of the ferroelectric films was affected by the preferred orientation of Pt foil, which is associated with the thickness. The 500 nm-thick CBTi144 films showed good ferro- and piezoelectric properties on 0.010 mm-thick Pt foils. The Pr and Ec were 26 μC/cm2 and 230 kV/cm, respectively, at an applied voltage of 75 V. The d33 was characterized as 25–34 pm/V by piezoresponse force microscopy. The values enhanced compared to those of the CBTi144 thin film with random orientation. The polar-axis oriented CBTi144 films would open for novel devices as Pb-free piezoelectric materials.
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77.84.-s; 68.37.-d; 81.15.-z
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Kato, K., Tanaka, K., Suzuki, K. et al. Structure and ferro-/piezoelectric properties of bimorph-shape CaBi4Ti4O15 films on Pt foils. Appl. Phys. A 80, 1481–1484 (2005). https://doi.org/10.1007/s00339-004-3189-6
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DOI: https://doi.org/10.1007/s00339-004-3189-6