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Defect-tolerant demultiplexers for nano-electronics constructed from error-correcting codes


We present a defect-tolerant methodology for the interconnect from conventional microelectronics to nano-electronic circuits. A relatively small amount of redundancy is added to a conventional demultiplexer that enables a specific element in an array of nano-wires to be addressed even if one or more connections to that nano-wire are defective. The k-bit address for each nano-wire is extended to a k+s-bit address by appending s check bits generated by an encoder. We demonstrate a systematic strategy for selecting effective encoding functions, based on error-correcting codes commonly used for digital data transmission. Small numbers of redundant address wires can provide significant protection from fabrication errors at the nano-scale in order to attain desired manufacturing yields. This coding gain can translate into significant economic gains in manufacturing costs.

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  1. J.R. Heath, P.J. Kuekes, G.S. Snider, R.S. Williams: Science 280, 1716 (1998)

    Article  Google Scholar 

  2. K. Nikolic, A. Sadek, M. Forshaw: Nanotechnology 13, 357 (2002)

    ADS  Article  Google Scholar 

  3. J. Han, P. Jonker: Nanotechnology 14, 224 (2003)

    ADS  Article  Google Scholar 

  4. P.J. Kuekes, R.S. Williams, J.R. Heath: US Patent No. 6 128 214 (2000)

  5. C.P. Collier, E.W. Wong, M. Belohradsky, F.M. Raymo, J.F. Stoddart, P.J. Kuekes, R.S. Williams, J.R. Heath: Science 285, 391 (1999)

    Article  Google Scholar 

  6. J.R. Heath, P.J. Kuekes, R.S. Williams: US Patent No. 6 459 095 (2002)

  7. Y. Luo, C.P. Collier, J.O. Jeppesen, K.A. Nielsen, E. Delonno, G. Ho, J. Perkins, H.-R. Tseng, T. Yamamoto, J.F. Stoddart, J.R. Heath: Chem. Phys. Chem. 3, 519 (2002)

    Google Scholar 

  8. Y. Chen, G.-Y. Jung, D.A.A. Ohlberg, X. Li, D.R. Stewart, J.O. Jeppesen, K.A. Nielsen, J.F. Stoddart, R.S. Williams: Nanotechnology 14, 462 (2003)

    ADS  Article  Google Scholar 

  9. Y. Chen, D.A.A. Ohlberg, X. Li, D.R. Stewart, R.S. Williams, J.O. Jeppesen, K.A. Nielsen, J.F. Stoddart, D.L. Olynick, E. Anderson: Appl. Phys. Lett 82, 1610 (2003)

    ADS  Article  Google Scholar 

  10. Z. Zhong, D. Wang, Y. Cui, M.W. Bockrath, C.M. Lieber: Science 302, 1377 (2003)

    ADS  Article  Google Scholar 

  11. A. DeHon: IEEE Trans. Nanotechnol. 2, 23 (2003)

    ADS  Article  Google Scholar 

  12. F.J. MacWilliams, N.J.A. Sloane: The Theory of Error-Correcting Codes (North-Holland, New York 1990)

  13. S.B. Wicker: Error Control Systems for Digital Communication and Storage (Prentice-Hall, Upper Saddle River 1995)

  14. D. Jaffe web site: ‘Information about binary linear codes’,∼djaffe/codes/webcodes/codeform.html

  15. P.J. Kuekes, W. Robinett, G. Seroussi, R.S. Williams: ‘Defect-Tolerant Interconnect to Nanoelectronic Circuits: Internally Redundant Demultiplexers Based on Error-Correcting Codes’, submitted to Nanotechnology (2004)

  16. International Technology Roadmap for Semiconductors, 2003 edn.,

  17. J. von Neumann: ‘Probabilistic Logics and the Synthesis of Reliable Organisms from Unreliable Components’. In: Automata Studies, ed. by C.E. Shannon, J. McCarthy (Princeton University Press, Princeton, NJ, USA 1956) pp. 43–98

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Correspondence to R. Stanley Williams.

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Kuekes, P., Robinett, W., Seroussi, G. et al. Defect-tolerant demultiplexers for nano-electronics constructed from error-correcting codes. Appl. Phys. A 80, 1161–1164 (2005).

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