Applied Physics A

, Volume 80, Issue 6, pp 1161–1164 | Cite as

Defect-tolerant demultiplexers for nano-electronics constructed from error-correcting codes

  • P.J. Kuekes
  • W. Robinett
  • G. Seroussi
  • R. Stanley WilliamsEmail author


We present a defect-tolerant methodology for the interconnect from conventional microelectronics to nano-electronic circuits. A relatively small amount of redundancy is added to a conventional demultiplexer that enables a specific element in an array of nano-wires to be addressed even if one or more connections to that nano-wire are defective. The k-bit address for each nano-wire is extended to a k+s-bit address by appending s check bits generated by an encoder. We demonstrate a systematic strategy for selecting effective encoding functions, based on error-correcting codes commonly used for digital data transmission. Small numbers of redundant address wires can provide significant protection from fabrication errors at the nano-scale in order to attain desired manufacturing yields. This coding gain can translate into significant economic gains in manufacturing costs.


Thin Film Operating Procedure Electronic Material Data Transmission Digital Data 
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Copyright information

© Springer-Verlag 2005

Authors and Affiliations

  • P.J. Kuekes
    • 1
  • W. Robinett
    • 1
  • G. Seroussi
    • 1
  • R. Stanley Williams
    • 1
    Email author
  1. 1.Hewlett-Packard LaboratoriesPalo AltoUSA

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