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TEM Characterisation of YNi2B2C Thin Film Microstructure

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Abstract

A thin film of the superconductor YNi2B2C deposited on an MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM). Plan-view TEM analyses show that the YNi2B2C film consists of isolated rectangular grains distributed within a second phase. This phase was identified as the monoclinic phase Y2Ni15B6 with lattice parameters a=1.422 nm,b=1.067 nm,c=0.958 nm and β=95°. Additionally, the cubic phase Y2O3 with lattice constant a=1.06 nm was identified within the film.

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Authors and Affiliations

  1. Institute of Structural Physics, TU Dresden, 01062, Dresden, Germany

    G.H. Cao, P. Simon & W. Skrotzki

  2. IFW Dresden, P.O. Box 270016, 01171, Dresden, Germany

    S.C. Wimbush & B. Holzapfel

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  1. G.H. Cao
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  2. P. Simon
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  3. W. Skrotzki
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  4. S.C. Wimbush
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  5. B. Holzapfel
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Correspondence to G.H. Cao.

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PACS

74.70.Dd; 74.78.Db; 68.37.Lp; 68.55.-a

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Cao, G., Simon, P., Skrotzki, W. et al. TEM Characterisation of YNi2B2C Thin Film Microstructure. Appl. Phys. A 81, 583–585 (2005). https://doi.org/10.1007/s00339-004-2768-x

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  • DOI: https://doi.org/10.1007/s00339-004-2768-x

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