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Effects of rf bias voltage and H2 flow rate on the growth of cubic boron nitride films by chemical vapor deposition

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Cubic boron nitride (cBN) films were deposited by rf bias-assisted dc plasma-jet chemical vapor deposition. Effects of H2 flow rate and bias voltage on the growth of the cBN films were investigated. High phase purity cBN (over 90%) can be obtained in a wide range of H2 flow rates of 5–10 sccm and bias voltages from -50 to -100 V. Nearly phase pure cBN films were deposited at a H2 flow rate of 10 sccm and bias voltages of -60 V and -70 V. The deposited films were characterized by Raman spectroscopy, Fourier-transform infrared spectroscopy, and glancing angle X-ray diffraction. Raman peaks were observed for all the cBN films, which indicate a good crystallinity of the films.

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Correspondence to S. Matsumoto.

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61.10.Eq; 78.30.-j; 81.15.Gh

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Yu, J., Matsumoto, S. & Okada, K. Effects of rf bias voltage and H2 flow rate on the growth of cubic boron nitride films by chemical vapor deposition. Appl. Phys. A 80, 777–781 (2005). https://doi.org/10.1007/s00339-004-2744-5

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