Abstract
Cubic boron nitride (cBN) films were deposited by rf bias-assisted dc plasma-jet chemical vapor deposition. Effects of H2 flow rate and bias voltage on the growth of the cBN films were investigated. High phase purity cBN (over 90%) can be obtained in a wide range of H2 flow rates of 5–10 sccm and bias voltages from -50 to -100 V. Nearly phase pure cBN films were deposited at a H2 flow rate of 10 sccm and bias voltages of -60 V and -70 V. The deposited films were characterized by Raman spectroscopy, Fourier-transform infrared spectroscopy, and glancing angle X-ray diffraction. Raman peaks were observed for all the cBN films, which indicate a good crystallinity of the films.
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P.B. Mirkarimi, K.F. McCarty, D.L. Medlin: Mater. Sci. Eng. 21, 47 (1997)
C. Ronning, E. Dreher, H. Feldermann, M. Gross, M. Sebastian, H. Hofsass: Diamond Relat. Mater. 6, 1129 (1997)
K. Inagawa, K. Watanabe, H. Ohsone, K. Saitoh, A. Itoh: J. Vac. Sci. Technol. A 5, 2696 (1987)
S. Mineta, M. Kolrata, N. Yasunaga, Y. Kikuta: Thin Solid Films 189, 125 (1990)
M. Mieno, T. Yoshida: Jpn. J. Appl. Phys. 29, 1175 (1990)
D.J. Kester, R. Messier: J. Appl. Phys. 72, 504 (1992)
N. Tanabe, T. Hayashi, M. Iwaki: Diamond Relat. Mater. 1, 883 (1992)
D.R. McKenzie, W.D. McFall, W.G. Sainty, C.A. Davis, R.E. Collins: Diamond Relat. Mater. 2, 970 (1993)
M.P. Johansson, I. Ivanoz, L. Hultman, P. Munger, A. Schutze: J. Vac. Sci. Technol. A 14, 3100 (1996)
S. Kidner, C.A. Taylor II, R. Clarke: Appl. Phys. Lett. 64, 1859 (1994)
A. Chayahara, H. Yokoyama, T. Imura, Y. Osaka: Jpn. J. Appl. Phys. 26, 1435 (1987)
A. Weber, U. Bringmann, R. Nikulski, C.P. Klarges: Surf. Coat. Technol. 60, 493 (1993)
W. Dworschak, K. Jung, H. Ehrhardt: Diamond Relat. Mater. 3, 337 (1994)
T. Ichiki, T. Momose, T. Yoshida: J. Appl. Phys. 75, 1330 (1994)
M. Kuhr, S. Reinke, W. Kulish: Diamond Relat. Mater. 4, 375 (1995)
K.L. Barth, A. Lunk, J. Ulmer: Surf. Coat. Technol. 92, 96 (1997)
D. Litvinov, R. Clarke: Appl. Phys. Lett. 74, 955 (1999)
K. Yamamoto, M. Keunecke, K. Bewilloga: Thin Solid Films 377–378, 331 (2000)
S. Matsumoto, W.J. Zhang: Jpn. J. Appl. Phys. 39, 442 (2000)
S. Matsumoto, W.J. Zhang: Diamond Relat. Mater. 10, 1868 (2001)
W.J. Zhang, S. Matsumoto: J. Mater. Res. 15, 2677 (2000)
Y.K. Le, H. Oechsner: Thin Solid Films 437, 83 (2003)
K. Nose, K. Tachibana, T. Yoshida: Appl. Phys. Lett. 83, 943 (2003)
W.J. Zhang, S. Matsumoto: Chem. Phys. Lett. 330, 243 (2000)
W.J. Zhang, S. Matsumoto: Appl. Phys. A 71, 469 (2000)
W.J.S. Matsumoto, Q. Li, I. Bello, S.T. Lee: Adv. Funct. Mater. 12, 250 (2002)
M. Mieno: Jpn. J. Appl. Phys. II 36, 1236 (1997)
T. Werninghaus, J. Hahn, F. Richter, D.R.T. Zahn: Appl. Phys. Lett. 70, 958 (1997)
T. Kuzuba, K. Era, T. Ishii, T. Sato: Solid State Commun. 25, 863 (1978)
H. Saitoh, W.A. Yarbrough: Appl. Phys. Lett. 58, 2228 (1991)
A.F. Jankowski, J.P. Hayes, D.M. Makowiecki, M.A. McKeman: Thin Solid Films 308, 94 (1997)
M.B. Mekki, M.A. Djouadi, V. Mortet, E. Guiot, G. Nouet, N. Mestres: Thin Solid Films 355–356, 89 (1999)
C.E. Bottani, R. Checchetto, A. Miotello, P.M. Ossi: Surf. Coat. Technol. 151–152, 151 (2002)
W.M. Holber, J. Forster: J. Vac. Sci. Technol. A 8, 3727 (1990)
W. Klass, R. Hauber, B. Lux: Diamond Relat. Mater. 7, 369 (1998)
S. Matsumoto, N. Nishida, K. Akashi, K. Sugai: J. Mater. Sci. 31, 713 (1996)
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61.10.Eq; 78.30.-j; 81.15.Gh
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Yu, J., Matsumoto, S. & Okada, K. Effects of rf bias voltage and H2 flow rate on the growth of cubic boron nitride films by chemical vapor deposition. Appl. Phys. A 80, 777–781 (2005). https://doi.org/10.1007/s00339-004-2744-5
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DOI: https://doi.org/10.1007/s00339-004-2744-5