Abstract
We investigated the electronic structure of epitaxially grown silver films on Cu(111) with and without adsorption of cesium by means of scanning tunneling spectroscopy and two-photon photoemission. This system has been chosen as a model system to engineer and measure the dynamics of charge-transfer processes between an adsorbate and a heterogeneous substrate. Special emphasis has been laid on the investigation of the energy shift of the Shockley-type surface state and an excited cesium resonance as a function of Ag film thickness. For the cesium resonance we observe an increase in line width with increasing layer thickness.
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68.37.Ef; 68.43.-h; 68.55.Jk; 73.20.-r
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Wessendorf, M., Wiemann, C., Bauer, M. et al. Electronic surface structure of n-ML Ag/Cu(111) and Cs/n-ML Ag/Cu(111) as investigated by 2PPE and STS. Appl Phys A 78, 183–188 (2004). https://doi.org/10.1007/s00339-003-2313-3
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DOI: https://doi.org/10.1007/s00339-003-2313-3