Abstract
The evolution of thin gold films deposited on a sapphire surface was studied in UHV using Auger electron spectroscopy and atomic force microscopy techniques. The annealing temperatures were in the range 573–843 K. Starting from a continuous film, we observed at the end of the process a collection of beads. The incubation time in this temperature range was negligible, while the agglomeration time varied from about 2 h at 573 K to a few minutes at 843 K. The kinetics of metal agglomeration allowed the evaluation of the surface self diffusion coefficients of gold which can be expressed by
Ds(m2/s)(573–843 K)=
3×10-11exp[-62±8(kJ/mol)/RT] .
These results are in reasonable agreement with other published data. This method provides a framework for the evaluation of surface diffusion parameters of other metals.
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PACS
68.35.Fx; 68.55.-a; 68.60.Dv
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Beszeda, I., Szabó, I. & Gontier-Moya, E. Morphological evolution of thin gold films studied by Auger electron spectroscopy in beading conditions. Appl. Phys. A 78, 1079–1084 (2004). https://doi.org/10.1007/s00339-003-2170-0
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DOI: https://doi.org/10.1007/s00339-003-2170-0