Abstract
The use of oxide materials in oxide electronics requires their controlled epitaxial growth. Recently, it was shown that Reflection High Energy Electron Diffraction (RHEED) allows the growth of oxide thin films to be monitored, even at high oxygen pressures. Here, we report the sub-unit cell molecular or block layer growth of the oxide materials Sr2RuO4, MgO, and magnetite using Pulsed Laser Deposition (PLD) from stoichiometric targets. Whereas a single RHEED intensity oscillation is found to correspond to the growth of a single unit cell for perovskites such as SrTiO3 or doped LaMnO3, in materials where the unit cell is composed of several molecular layers or blocks with identical stoichiometry, sub-unit cell molecular or block layer growth is established, resulting in several RHEED intensity oscillations during the growth of a single unit cell.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
M.G. Lagally, D.E. Savage: MRS Bull. XVIII, 24 (1993)
T. Terashima, Y. Bando, K. Iijima, K. Yamamoto, K. Hirata, K. Hayashi, K. Kamigaki, H. Terauchi: Phys. Rev. Lett. 65, 2684 (1990)
H. Karl, B. Stritzker: Phys. Rev. Lett. 69, 2939 (1992)
I. Bozovic, J.N. Eckstein: MRS Bull. XX, 32 (1995)
G.J.H.M. Rijnders, G. Koster, D.H.A. Blank, H. Rogalla: Appl. Phys. Lett. 70, 1888 (1997)
J. Klein, C. Höfener, L. Alff, R. Gross: Supercond. Sci. Technol. 12, 1023 (1999); see also J. Magn. Magn. Mater. 211, 9 (2000)
R. Gross, J. Klein, B. Wiedenhorst, C. Höfener, U. Schoop, J.B. Philipp, M. Schonecke, F. Herbstritt, L. Alff, Y.-F. Lu, A. Marx, S. Schymon, S. Thienhaus , W. Mader: SPIE Conf. Proc. 4058, 278 (2000)
P.J. Dobson, B.A. Joyce, J.H. Neave: J. Cryst. Growth 81, 1 (1987)
D.G. Schlom, Y. Jia, L.-N. Zou, J.H. Haeni, S. Briczinski, M.A. Zurbuchen, C.W. Leitz, S. Madhavan, S. Wozniak, Y. Liu, M.E. Hawley, G.W. Brown, A. Dabkowski, H.A. Dabkowska, R. Uecker, P. Reiche: SPIE Conf. Proc. 3481, 226 (1998)
Bruker AXS Windows RefSim simulation software, based on dynamical scattering theory
U. Korte, P.A. Maksym: Phys. Rev. Lett. 78, 2381 (1997)
B.A. Joyce, J.H. Neave, J. Zhang, P.J. Dobson: In Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces, ed. by P.K. Larsen, P.J. Dobson (Plenum, London 1988) pp. 397–417
W. Braun: Applied RHEED (Springer-Verlag, Berlin, Heidelberg 1999)
S. Kale, S.M. Bhagat, S.E. Lofland, T. Scabarozi, S.B. Ogale, A. Orozco, S.R. Shinde, T. Venkatesan, B. Hannoyer, B. Mercey, W. Prellier: Phys. Rev. B 64, 205413 (2001)
J.B. Philipp, J. Klein, C. Recher, T. Walther, W. Mader, M. Schmid, R. Suryanarayanan , L. Alff, R. Gross: Phys. Rev. B 65, 184411 (2002)
Author information
Authors and Affiliations
Corresponding author
Additional information
PACS
61.14.Hg; 74.76.Db; 75.70.-i; 81.15.Fg
Rights and permissions
About this article
Cite this article
Reisinger , D., Blass , B., Klein , J. et al. Sub-unit cell layer-by-layer growth of Fe3O4, MgO, and Sr2RuO4 thin films. Appl. Phys. A 77, 619–621 (2003). https://doi.org/10.1007/s00339-003-2105-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00339-003-2105-9