Abstract.
Interfaces with vapor-deposited polyaniline thin films are investigated using angle-resolved X-ray photoemission spectroscopy. We demonstrate that a diffuse interface is formed with sodium deposited on top of polyaniline, and the distribution of sodium atoms, in the near surface region of the polyaniline thin film, is quite uniform. In comparison, the interface between polyaniline and another polymer, PVDF-TrFE, is rather abrupt and a flat-band model can be applied to the interface band structure.
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Received: 29 November 2002 / Accepted: 16 December 2002 / Published online: 28 March 2003
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Xu, B., Caruso, A. & Dowben, P. Interfaces with vapor-evaporated polyaniline thin films . Appl Phys A 77, 155–158 (2003). https://doi.org/10.1007/s00339-003-2082-z
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DOI: https://doi.org/10.1007/s00339-003-2082-z