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Control of deviatoric stress in the diamond anvil cell through thermal expansion mismatch stress in thin films

Abstract

Elastic and plastic properties of materials and phase transitions at extreme conditions vary with both hydrostatic pressure and deviatoric stress. To generate and measure controlled deviatoric stress at pressures beyond those accessible with large volume differential and rotational presses and optical access for spectroscopy, experiments tested the combination of diamond anvil cell and thin film technology. Thin films of polycrystalline Cr-doped Al2O3 ruby were prepared using pulsed laser deposition on single-crystal substrates of either Al2O3 sapphire or yttria-stabilized cubic zirconia for contrasting initial film stress, and loaded in diamond anvil cells for confining stress. The piezospectroscopic response of the ruby films demonstrates consistently higher deviatoric stress in the film on zirconia relative to the film on the control sapphire, and an increase in deviatoric stress with applied load. Complementary synchrotron X-ray diffraction of the zirconia substrate confirmed that no pressure-induced phase transitions impacted the stress state of the ruby film, but differences in compressibility of film and substrate result in changes in film stress analogous to thermal expansion mismatch. This technique may be applied to evaluate elastic and plastic response of thin films of a variety of materials under extreme stress.

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Acknowledgements

Samples used in these experiments were provided by J. D. Nicholas and E. M. Straley. We thank M. Calderon Cueva and A. Pease for helpful discussion of single-crystal diffraction analysis. This work has been supported by the US Department of Energy, National Nuclear Security Administration, through the Capital-DOE Alliance Center (DE-NA0003858), and new faculty startup funding to S. M. Dorfman. Support for B. Arroyo was provided by the GeoCaFES program, NSF Geopaths grant 2023059. M. Lv’s contribution is based upon work supported by Laboratory Directed Research and Development (LDRD) funding from Argonne National Laboratory, provided by the Director, Office of Science, of the U.S. Department of Energy under Contract No. DE-AC02-06CH11357. Portions of this work were performed at HPCAT (Sector 16), Advanced Photon Source (APS), Argonne National Laboratory. HPCAT operations are supported by DOE-NNSA’s Office of Experimental Sciences. Use of the COMPRES-GSECARS gas loading system was supported by COMPRES under NSF Cooperative Agreement EAR-1606856 and by GSECARS through NSF grant EAR-1634415 and DOE grant DE-FG02-94ER14466. The Advanced Photon Source is a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.

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Correspondence to Susannah M. Dorfman.

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This article is part of a Topical Collection “Experimental & Analytical Techniques at Extreme & Ambient Conditions”, guest edited by Stella Chariton, Vitali B. Prakapenka and Haozhe (Arthur) Liu.

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Dorfman, S.M., Najiba, S., Arroyo, B. et al. Control of deviatoric stress in the diamond anvil cell through thermal expansion mismatch stress in thin films. Phys Chem Minerals 49, 16 (2022). https://doi.org/10.1007/s00269-022-01191-9

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  • DOI: https://doi.org/10.1007/s00269-022-01191-9

Keywords

  • Ruby fluorescence
  • Diamond anvil cell
  • Thin films
  • Piezospectroscopy
  • Mechanical stress